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Title: Characterization of domain structure in one-dimensional SrRuO{sub 3} nanostructure using synchrotron x-ray microdiffraction

Abstract

SrRuO{sub 3} (SRO) thin films with a geometric shape of one-dimensional stripes can be epitaxially grown on a SrTiO{sub 3} (STO) substrate. Conventional X-ray reciprocal space map (RSM) measurements revealed that the stripes consist of multiple crystallographic domains. We performed synchrotron X-ray microdiffraction measurements to determine whether the single stripe of the SRO has a single crystallographic domain or not. Spacing between stripes is ~200 nm that is comparable to a beam size available for the microdiffraction. The synchrotron X-ray microdiffraction experiment was performed at BL13XU, SPring-8. RSMs of asymmetric diffractions around STO 204 reflection were measured by a broad-beam (200 × 200 µm{sup 2}) and the sub-micro-beam (250(h) × 190(v) nm{sup 2}). Both SRO 260 and 620 are seen in the RSM measured by the broad-beam due to the crystallographic twinning. On the other hand, only SRO 620 is observed in the RSM measured by the sub-micro-beam. The result shows the domain length of the single stripe SRO thin film is longer than the vertical beam size of 190 nm.

Authors:
 [1];  [1];  [2]; ;  [3];  [2]
  1. Japan Synchrotron Radiation Research Institute (JASRI/SPring-8), Sayo, Hyogo 679-5198 Japan (Japan)
  2. (Japan)
  3. Japan Science and Technology Agency, CREST, Uji, Kyoto 611-0011 (Japan)
Publication Date:
OSTI Identifier:
22608439
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1741; Journal Issue: 1; Conference: SRI2015: 12. international conference on synchrotron radiation instrumentation, New York, NY (United States), 6-10 Jul 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; ASYMMETRY; BEAMS; CRYSTALLOGRAPHY; DIFFRACTION; DOMAIN STRUCTURE; EPITAXY; NANOPARTICLES; NANOSTRUCTURES; ONE-DIMENSIONAL CALCULATIONS; OXYGEN COMPOUNDS; REFLECTION; RUTHENIUM COMPOUNDS; SPRING-8 STORAGE RING; STRONTIUM COMPOUNDS; STRONTIUM OXIDES; STRONTIUM TITANATES; SUBSTRATES; SYNCHROTRONS; THIN FILMS; X RADIATION

Citation Formats

Imai, Yasuhiko, E-mail: imai@spring8.or.jp, Kimura, Shigeru, Japan Science and Technology Agency, CREST, Uji, Kyoto 611-0011, Kan, Daisuke, Shimakawa, Yuichi, and Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011. Characterization of domain structure in one-dimensional SrRuO{sub 3} nanostructure using synchrotron x-ray microdiffraction. United States: N. p., 2016. Web. doi:10.1063/1.4952934.
Imai, Yasuhiko, E-mail: imai@spring8.or.jp, Kimura, Shigeru, Japan Science and Technology Agency, CREST, Uji, Kyoto 611-0011, Kan, Daisuke, Shimakawa, Yuichi, & Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011. Characterization of domain structure in one-dimensional SrRuO{sub 3} nanostructure using synchrotron x-ray microdiffraction. United States. doi:10.1063/1.4952934.
Imai, Yasuhiko, E-mail: imai@spring8.or.jp, Kimura, Shigeru, Japan Science and Technology Agency, CREST, Uji, Kyoto 611-0011, Kan, Daisuke, Shimakawa, Yuichi, and Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011. 2016. "Characterization of domain structure in one-dimensional SrRuO{sub 3} nanostructure using synchrotron x-ray microdiffraction". United States. doi:10.1063/1.4952934.
@article{osti_22608439,
title = {Characterization of domain structure in one-dimensional SrRuO{sub 3} nanostructure using synchrotron x-ray microdiffraction},
author = {Imai, Yasuhiko, E-mail: imai@spring8.or.jp and Kimura, Shigeru and Japan Science and Technology Agency, CREST, Uji, Kyoto 611-0011 and Kan, Daisuke and Shimakawa, Yuichi and Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011},
abstractNote = {SrRuO{sub 3} (SRO) thin films with a geometric shape of one-dimensional stripes can be epitaxially grown on a SrTiO{sub 3} (STO) substrate. Conventional X-ray reciprocal space map (RSM) measurements revealed that the stripes consist of multiple crystallographic domains. We performed synchrotron X-ray microdiffraction measurements to determine whether the single stripe of the SRO has a single crystallographic domain or not. Spacing between stripes is ~200 nm that is comparable to a beam size available for the microdiffraction. The synchrotron X-ray microdiffraction experiment was performed at BL13XU, SPring-8. RSMs of asymmetric diffractions around STO 204 reflection were measured by a broad-beam (200 × 200 µm{sup 2}) and the sub-micro-beam (250(h) × 190(v) nm{sup 2}). Both SRO 260 and 620 are seen in the RSM measured by the broad-beam due to the crystallographic twinning. On the other hand, only SRO 620 is observed in the RSM measured by the sub-micro-beam. The result shows the domain length of the single stripe SRO thin film is longer than the vertical beam size of 190 nm.},
doi = {10.1063/1.4952934},
journal = {AIP Conference Proceedings},
number = 1,
volume = 1741,
place = {United States},
year = 2016,
month = 7
}
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