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Title: Characterization of domain structure in one-dimensional SrRuO{sub 3} nanostructure using synchrotron x-ray microdiffraction

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4952934· OSTI ID:22608439
 [1];  [1]; ;  [2]
  1. Japan Synchrotron Radiation Research Institute (JASRI/SPring-8), Sayo, Hyogo 679-5198 Japan (Japan)
  2. Japan Science and Technology Agency, CREST, Uji, Kyoto 611-0011 (Japan)

SrRuO{sub 3} (SRO) thin films with a geometric shape of one-dimensional stripes can be epitaxially grown on a SrTiO{sub 3} (STO) substrate. Conventional X-ray reciprocal space map (RSM) measurements revealed that the stripes consist of multiple crystallographic domains. We performed synchrotron X-ray microdiffraction measurements to determine whether the single stripe of the SRO has a single crystallographic domain or not. Spacing between stripes is ~200 nm that is comparable to a beam size available for the microdiffraction. The synchrotron X-ray microdiffraction experiment was performed at BL13XU, SPring-8. RSMs of asymmetric diffractions around STO 204 reflection were measured by a broad-beam (200 × 200 µm{sup 2}) and the sub-micro-beam (250(h) × 190(v) nm{sup 2}). Both SRO 260 and 620 are seen in the RSM measured by the broad-beam due to the crystallographic twinning. On the other hand, only SRO 620 is observed in the RSM measured by the sub-micro-beam. The result shows the domain length of the single stripe SRO thin film is longer than the vertical beam size of 190 nm.

OSTI ID:
22608439
Journal Information:
AIP Conference Proceedings, Vol. 1741, Issue 1; Conference: SRI2015: 12. international conference on synchrotron radiation instrumentation, New York, NY (United States), 6-10 Jul 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English