skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Multiplexed high resolution soft x-ray RIXS

Abstract

High-resolution Resonance Inelastic X-ray Scattering (RIXS) is a technique that allows us to probe the electronic excitations of complex materials with unprecedented precision. However, the RIXS process has a low cross section, compounded by the fact that the optical spectrometers used to analyze the scattered photons can only collect a small solid angle and overall have a small efficiency. Here we present a method to significantly increase the throughput of RIXS systems, by energy multiplexing, so that a complete RIXS map of scattered intensity versus photon energy in and photon energy out can be recorded simultaneously{sup 1}. This parallel acquisition scheme should provide a gain in throughput of over 100.. A system based on this principle, QERLIN, is under construction at the Advanced Light Source (ALS).

Authors:
; ; ; ; ; ;  [1]
  1. Center for X-ray Optics Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States)
Publication Date:
OSTI Identifier:
22608437
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1741; Journal Issue: 1; Conference: SRI2015: 12. international conference on synchrotron radiation instrumentation, New York, NY (United States), 6-10 Jul 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ADVANCED LIGHT SOURCE; CROSS SECTIONS; EFFICIENCY; EXCITATION; OPTICAL SPECTROMETERS; PHOTONS; RESOLUTION; RESONANCE; SCATTERING; SOFT X RADIATION; SOLIDS; X-RAY DIFFRACTION

Citation Formats

Chuang, Y. -D., Voronov, D., Warwick, T., Yashchuk, V., Padmore, H. A., E-mail: hapadmore@lbl.gov, Anderson, C., Benk, M., and Goldberg, K. Multiplexed high resolution soft x-ray RIXS. United States: N. p., 2016. Web. doi:10.1063/1.4952931.
Chuang, Y. -D., Voronov, D., Warwick, T., Yashchuk, V., Padmore, H. A., E-mail: hapadmore@lbl.gov, Anderson, C., Benk, M., & Goldberg, K. Multiplexed high resolution soft x-ray RIXS. United States. https://doi.org/10.1063/1.4952931
Chuang, Y. -D., Voronov, D., Warwick, T., Yashchuk, V., Padmore, H. A., E-mail: hapadmore@lbl.gov, Anderson, C., Benk, M., and Goldberg, K. 2016. "Multiplexed high resolution soft x-ray RIXS". United States. https://doi.org/10.1063/1.4952931.
@article{osti_22608437,
title = {Multiplexed high resolution soft x-ray RIXS},
author = {Chuang, Y. -D. and Voronov, D. and Warwick, T. and Yashchuk, V. and Padmore, H. A., E-mail: hapadmore@lbl.gov and Anderson, C. and Benk, M. and Goldberg, K.},
abstractNote = {High-resolution Resonance Inelastic X-ray Scattering (RIXS) is a technique that allows us to probe the electronic excitations of complex materials with unprecedented precision. However, the RIXS process has a low cross section, compounded by the fact that the optical spectrometers used to analyze the scattered photons can only collect a small solid angle and overall have a small efficiency. Here we present a method to significantly increase the throughput of RIXS systems, by energy multiplexing, so that a complete RIXS map of scattered intensity versus photon energy in and photon energy out can be recorded simultaneously{sup 1}. This parallel acquisition scheme should provide a gain in throughput of over 100.. A system based on this principle, QERLIN, is under construction at the Advanced Light Source (ALS).},
doi = {10.1063/1.4952931},
url = {https://www.osti.gov/biblio/22608437}, journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1741,
place = {United States},
year = {Wed Jul 27 00:00:00 EDT 2016},
month = {Wed Jul 27 00:00:00 EDT 2016}
}