Energy dispersive detector for white beam synchrotron x-ray fluorescence imaging

Journal Article · Wed Jul 27 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4952928· OSTI ID:22608434

Seller, Paul; Veale, Matthew C. ^[1]; Connolley, Thomas ^[2]; Dolbnya, Igor P.; Malandain, Andrew; Sawhney, Kawal ^[3]; Grant, Patrick S.; Liotti, Enzo; Lui, Andrew ^[4]

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1. Science and Technology Facilities Council, Rutherford Appleton Laboratory, Harwell Campus,UK (United Kingdom)
2. Diamond Light Source, I12 Beamline, Harwell Campus, Didcot, Oxfordshire (United Kingdom)
3. Diamond Light Source, B16 Beamline, Harwell Campus, Didcot, Oxfordshire (United Kingdom)
4. Department of Materials, University of Oxford Parks Road, Oxford (United Kingdom)

A novel, “single-shot” fluorescence imaging technique has been demonstrated on the B16 beamline at the Diamond Light Source synchrotron using the HEXITEC energy dispersive imaging detector. A custom made furnace with 200µm thick metal alloy samples was positioned in a white X-ray beam with a hole made in the furnace walls to allow the transmitted beam to be imaged with a conventional X-ray imaging camera consisting of a 500 µm thick single crystal LYSO scintillator, mirror and lens coupled to an AVT Manta G125B CCD sensor. The samples were positioned 45° to the incident beam to enable simultaneous transmission and fluorescence imaging. The HEXITEC detector was positioned at 90° to the sample with a 50 µm pinhole 13 cm from the sample and the detector positioned 2.3m from pinhole. The geometric magnification provided a field of view of 1.1×1.1mm{sup 2} with one of the 80×80 pixels imaging an area equivalent to 13µm{sup 2}. Al-Cu alloys doped with Zr, Ag and Mo were imaged in transmission and fluorescence mode. The fluorescence images showed that the dopant metals could be simultaneously imaged with sufficient counts on all 80x80 pixels within 60 s, with the X-ray flux limiting the fluorescence imaging rate. This technique demonstrated that it is possible to simultaneously image and identify multiple elements on a spatial resolution scale ~10µm or higher without the time consuming need to scan monochromatic energies or raster scan a focused beam of X-rays. Moving to high flux beamlines and using an array of detectors could improve the imaging speed of the technique with element specific imaging estimated to be on a 1 s timescale.

• OSTI ID: 22608434
• Journal Information: AIP Conference Proceedings, Vol. 1741, Issue 1; Conference: SRI2015: 12. international conference on synchrotron radiation instrumentation, New York, NY (United States), 6-10 Jul 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALLOYS
ALUMINIUM
BEAM OPTICS
CHARGE-COUPLED DEVICES
COPPER
DIAMONDS
DOPED MATERIALS
FLUORESCENCE
METALS
MIRRORS
MOLYBDENUM ADDITIONS
MONOCHROMATIC RADIATION
MONOCRYSTALS
SENSORS
SILVER ADDITIONS
SPATIAL RESOLUTION
SYNCHROTRONS
TRANSMISSION
X RADIATION
ZIRCONIUM ADDITIONS