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Title: On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II

Abstract

A novel on-axis X-ray microscope with 3 µm resolution, 3x magnification, and a working distance of 600 mm for in-situ sample alignment and X-ray beam visualization for the Inelastic X-ray Scattering (IXS) beamline at NSLS-II is presented. The microscope uses reflective optics, which minimizes dispersion, and allows imaging from Ultraviolet (UV) to Infrared (IR) with specifically chosen objective components (coatings, etc.). Additionally, a portable high resolution X-ray microscope for KB mirror alignment and X-ray beam characterization was developed.

Authors:
; ; ; ;  [1];  [2]
  1. National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973 (United States)
  2. Department of Physics and Astronomy, Stony Brook University, NY 11794 (United States)
Publication Date:
OSTI Identifier:
22608363
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1741; Journal Issue: 1; Conference: SRI2015: 12. international conference on synchrotron radiation instrumentation, New York, NY (United States), 6-10 Jul 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BEAMS; BIOMEDICAL RADIOGRAPHY; DISPERSIONS; INELASTIC SCATTERING; MICROSCOPES; MIRRORS; NSLS; RESOLUTION; ULTRAVIOLET RADIATION; X RADIATION; X-RAY DIFFRACTION

Citation Formats

Gofron, K. J., E-mail: kgofron@bnl.gov, Cai, Y. Q., Coburn, D. S., Antonelli, S., Suvorov, A., and Flores, J. On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II. United States: N. p., 2016. Web. doi:10.1063/1.4952850.
Gofron, K. J., E-mail: kgofron@bnl.gov, Cai, Y. Q., Coburn, D. S., Antonelli, S., Suvorov, A., & Flores, J. On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II. United States. doi:10.1063/1.4952850.
Gofron, K. J., E-mail: kgofron@bnl.gov, Cai, Y. Q., Coburn, D. S., Antonelli, S., Suvorov, A., and Flores, J. 2016. "On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II". United States. doi:10.1063/1.4952850.
@article{osti_22608363,
title = {On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II},
author = {Gofron, K. J., E-mail: kgofron@bnl.gov and Cai, Y. Q. and Coburn, D. S. and Antonelli, S. and Suvorov, A. and Flores, J.},
abstractNote = {A novel on-axis X-ray microscope with 3 µm resolution, 3x magnification, and a working distance of 600 mm for in-situ sample alignment and X-ray beam visualization for the Inelastic X-ray Scattering (IXS) beamline at NSLS-II is presented. The microscope uses reflective optics, which minimizes dispersion, and allows imaging from Ultraviolet (UV) to Infrared (IR) with specifically chosen objective components (coatings, etc.). Additionally, a portable high resolution X-ray microscope for KB mirror alignment and X-ray beam characterization was developed.},
doi = {10.1063/1.4952850},
journal = {AIP Conference Proceedings},
number = 1,
volume = 1741,
place = {United States},
year = 2016,
month = 7
}
  • A versatile and easy-to-use computer software package has been developed for equipment control, data acquisition and analysis at the MATRIX X-18A x-ray scattering beamline at the National Synchrotron Light Source. The software runs on any IBM-compatible personal computer running under MS-DOS and makes use of the GPIB and AT-Bus interfaces. The menu-driven program is user friendly for a wide range of x-ray experiments through control of all aspects of the x-ray beamline. Equipment interfaces include counter-timer, stepping motor controllers, multichannel analyzer, and temperature controller. Real space and reciprocal space scans are possible, as well as an external file scan, whichmore » allows control of up to six diffractometer motions plus the energy simultaneously. Orientation matrix calculations, peak fitting routines, and an extensive help file system are included. Plans are presently underway to upgrade the software to run under Windows NT. {copyright} {ital 1996 American Institute of Physics.}« less
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