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Title: High resolution, monochromatic x-ray topography capability at CHESS

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4952849· OSTI ID:22608362
;  [1];  [2]; ;  [3];  [4];  [5]
  1. CHESS, Cornell University, Ithaca, NY (United States)
  2. Department of Physics, University of Connecticut, Storrs, CT (United States)
  3. IIa Technologies (Singapore)
  4. St. Mary’s College of Maryland, St. Mary’s City, MD (United States)
  5. CLASSE, Cornell University, Ithaca, NY (United States)

CHESS has a monochromatic x-ray topography capability serving continually expanding user interest. The setup consists of a beam expanding monochromator, 6-circle diffactometer, and CHESS designed CMOS camera with real time sample-alignment capability. This provides rocking curve mapping with angle resolution as small as 2 µradians, spatial resolution to 3 microns, and field of view up to 7mm. Thus far the capability has been applied for: improving CVD-diamond growth, evaluating perfection of ultra-thin diamond membranes, correlating performance of diamond-based electronics with crystal defect structure, and defect analysis of single crystal silicon carbide. This paper describes our topography system, explains its capabilities, and presents experimental results from several applications.

OSTI ID:
22608362
Journal Information:
AIP Conference Proceedings, Vol. 1741, Issue 1; Conference: SRI2015: 12. international conference on synchrotron radiation instrumentation, New York, NY (United States), 6-10 Jul 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English