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Title: Growing barium hexaferrite (BaFe{sub 12}O{sub 19}) thin films using chemical solution deposition

Abstract

Barium hexaferrite (BaFe{sub 12}O{sub 19}, or simply known as BaM) thin films has been recognized as a potential candidate for microwave-based devices, magnetic recording media and data storage. To grow BaM thin films, chemical solution deposition is conducted using the aqueous solution of metal nitrates, which involves spin coatings on Si substrates. Furthermore, Thermal Gravimeter Analysis (TGA), X-Ray Diffractometer (XRD), Scanning Electron Microscopy (SEM) and Vibrating Sample Magnetometer (VSM) are applied to evaluate the decomposition behavior, structure, morphology, and magnetic properties of BaM thin films. Additionally, the effects of number of layers variation are also investigated. Finally, magnetic properties analysis indicates the isotropic nature of the films.

Authors:
 [1];  [2]
  1. Graduate Program of Materials Science, Department of Physics, FMIPA, Universitas Indonesia, Kampus UI Depok (Indonesia)
  2. Multiferroic Laboratory, Department of Physics, FMIPA, Universitas Indonesia, Kampus UI Depok (Indonesia)
Publication Date:
OSTI Identifier:
22606700
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1729; Journal Issue: 1; Conference: ISCPMS 2015: 1. international symposium on current progress in mathematics and sciences, Depok (Indonesia), 3-4 Nov 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; BARIUM COMPOUNDS; DECOMPOSITION; DEPOSITION; ELECTRON SCANNING; FERRITES; MAGNETIC PROPERTIES; MICROWAVE RADIATION; SCANNING ELECTRON MICROSCOPY; SPIN; SPIN-ON COATINGS; SUBSTRATES; THERMAL GRAVIMETRIC ANALYSIS; THIN FILMS; VIBRATING SAMPLE MAGNETOMETERS; X RADIATION; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS

Citation Formats

Budiawanti, Sri, Faculty of Teacher Training and Education, Sebelas Maret University, and Soegijono, Bambang. Growing barium hexaferrite (BaFe{sub 12}O{sub 19}) thin films using chemical solution deposition. United States: N. p., 2016. Web. doi:10.1063/1.4946923.
Budiawanti, Sri, Faculty of Teacher Training and Education, Sebelas Maret University, & Soegijono, Bambang. Growing barium hexaferrite (BaFe{sub 12}O{sub 19}) thin films using chemical solution deposition. United States. doi:10.1063/1.4946923.
Budiawanti, Sri, Faculty of Teacher Training and Education, Sebelas Maret University, and Soegijono, Bambang. Tue . "Growing barium hexaferrite (BaFe{sub 12}O{sub 19}) thin films using chemical solution deposition". United States. doi:10.1063/1.4946923.
@article{osti_22606700,
title = {Growing barium hexaferrite (BaFe{sub 12}O{sub 19}) thin films using chemical solution deposition},
author = {Budiawanti, Sri and Faculty of Teacher Training and Education, Sebelas Maret University and Soegijono, Bambang},
abstractNote = {Barium hexaferrite (BaFe{sub 12}O{sub 19}, or simply known as BaM) thin films has been recognized as a potential candidate for microwave-based devices, magnetic recording media and data storage. To grow BaM thin films, chemical solution deposition is conducted using the aqueous solution of metal nitrates, which involves spin coatings on Si substrates. Furthermore, Thermal Gravimeter Analysis (TGA), X-Ray Diffractometer (XRD), Scanning Electron Microscopy (SEM) and Vibrating Sample Magnetometer (VSM) are applied to evaluate the decomposition behavior, structure, morphology, and magnetic properties of BaM thin films. Additionally, the effects of number of layers variation are also investigated. Finally, magnetic properties analysis indicates the isotropic nature of the films.},
doi = {10.1063/1.4946923},
journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1729,
place = {United States},
year = {2016},
month = {4}
}