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Title: Large aperture Fizeau interferometer commissioning and preliminary measurements of a long x-ray mirror at European X-ray Free Electron Laser

Abstract

The European XFEL (X-ray Free Electron Laser) is a large facility under construction in Hamburg, Germany. It will provide a transversally fully coherent x-ray radiation with outstanding characteristics: high repetition rate (up to 2700 pulses with a 0.6 ms long pulse train at 10 Hz), short wavelength (down to 0.05 nm), short pulse (in the femtoseconds scale), and high average brilliance (1.6 ⋅ 10{sup 25} (photons s{sup −1} mm{sup −2} mrad{sup −2})/0.1% bandwidth). The beam has very high pulse energy; therefore, it has to be spread out on a relatively long mirror (about 1 m). Due to the very short wavelength, the mirrors need to have a high quality surface on their entire length, and this is considered very challenging even with the most advanced polishing methods. In order to measure the mirrors and to characterize their interaction with the mechanical mount, we equipped a metrology laboratory with a large aperture Fizeau interferometer. The system is a classical 100 mm diameter commercial Fizeau, with an additional expander providing a 300 mm diameter beam. Despite the commercial nature of the system, special care has been taken in the polishing of the reference flats and in the expander quality. We report themore » first commissioning of the instrument, its calibration, and performance characterization, together with some preliminary results with the measurement of a 950 mm silicon substrate. The intended application is to characterize the final XFEL mirrors with nanometer accuracy.« less

Authors:
 [1]
  1. European XFEL GmbH, Albert-Einstein-Ring 19, 22761 Hamburg (Germany)
Publication Date:
OSTI Identifier:
22598010
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 5; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; APERTURES; CALIBRATION; ELECTRONS; FREE ELECTRON LASERS; INTERFEROMETERS; MIRRORS; PHOTONS; POLISHING; PULSES; SILICON; SUBSTRATES; SURFACES; WAVELENGTHS; X RADIATION

Citation Formats

Vannoni, M., E-mail: maurizio.vannoni@xfel.eu, and Freijo Martín, I. Large aperture Fizeau interferometer commissioning and preliminary measurements of a long x-ray mirror at European X-ray Free Electron Laser. United States: N. p., 2016. Web. doi:10.1063/1.4949005.
Vannoni, M., E-mail: maurizio.vannoni@xfel.eu, & Freijo Martín, I. Large aperture Fizeau interferometer commissioning and preliminary measurements of a long x-ray mirror at European X-ray Free Electron Laser. United States. https://doi.org/10.1063/1.4949005
Vannoni, M., E-mail: maurizio.vannoni@xfel.eu, and Freijo Martín, I. Sun . "Large aperture Fizeau interferometer commissioning and preliminary measurements of a long x-ray mirror at European X-ray Free Electron Laser". United States. https://doi.org/10.1063/1.4949005.
@article{osti_22598010,
title = {Large aperture Fizeau interferometer commissioning and preliminary measurements of a long x-ray mirror at European X-ray Free Electron Laser},
author = {Vannoni, M., E-mail: maurizio.vannoni@xfel.eu and Freijo Martín, I.},
abstractNote = {The European XFEL (X-ray Free Electron Laser) is a large facility under construction in Hamburg, Germany. It will provide a transversally fully coherent x-ray radiation with outstanding characteristics: high repetition rate (up to 2700 pulses with a 0.6 ms long pulse train at 10 Hz), short wavelength (down to 0.05 nm), short pulse (in the femtoseconds scale), and high average brilliance (1.6 ⋅ 10{sup 25} (photons s{sup −1} mm{sup −2} mrad{sup −2})/0.1% bandwidth). The beam has very high pulse energy; therefore, it has to be spread out on a relatively long mirror (about 1 m). Due to the very short wavelength, the mirrors need to have a high quality surface on their entire length, and this is considered very challenging even with the most advanced polishing methods. In order to measure the mirrors and to characterize their interaction with the mechanical mount, we equipped a metrology laboratory with a large aperture Fizeau interferometer. The system is a classical 100 mm diameter commercial Fizeau, with an additional expander providing a 300 mm diameter beam. Despite the commercial nature of the system, special care has been taken in the polishing of the reference flats and in the expander quality. We report the first commissioning of the instrument, its calibration, and performance characterization, together with some preliminary results with the measurement of a 950 mm silicon substrate. The intended application is to characterize the final XFEL mirrors with nanometer accuracy.},
doi = {10.1063/1.4949005},
url = {https://www.osti.gov/biblio/22598010}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 5,
volume = 87,
place = {United States},
year = {2016},
month = {5}
}