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Title: Scanning thermal microscopy based on a quartz tuning fork and a micro-thermocouple in active mode (2ω method)

Abstract

A novel probe for scanning thermal microscope using a micro-thermocouple probe placed on a Quartz Tuning Fork (QTF) is presented. Instead of using an external deflection with a cantilever beam for contact detection, an original combination of piezoelectric resonator and thermal probe is employed. Due to a non-contact photothermal excitation principle, the high quality factor of the QTF allows the probe-to-surface contact detection. Topographic and thermal scanning images obtained on a specific sample points out the interest of our system as an alternative to cantilevered resistive probe systems which are the most spread.

Authors:
; ; ; ; ;  [1]
  1. FEMTO-ST Institute UMR 6174, Université de Franche-Comté, CNRS, ENSMM, UTBM, 15B Avenue des Montboucons, F-25030 Besançon (France)
Publication Date:
OSTI Identifier:
22597975
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 87; Journal Issue: 6; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BEAMS; DETECTION; EXCITATION; IMAGES; MICROSCOPES; MICROSCOPY; PIEZOELECTRICITY; PROBES; QUALITY FACTOR; QUARTZ; RESONATORS; SURFACES; THERMOCOUPLES; TUNING

Citation Formats

Bontempi, Alexia, Nguyen, Tran Phong, Salut, Roland, Thiery, Laurent, Teyssieux, Damien, and Vairac, Pascal. Scanning thermal microscopy based on a quartz tuning fork and a micro-thermocouple in active mode (2ω method). United States: N. p., 2016. Web. doi:10.1063/1.4952958.
Bontempi, Alexia, Nguyen, Tran Phong, Salut, Roland, Thiery, Laurent, Teyssieux, Damien, & Vairac, Pascal. Scanning thermal microscopy based on a quartz tuning fork and a micro-thermocouple in active mode (2ω method). United States. doi:10.1063/1.4952958.
Bontempi, Alexia, Nguyen, Tran Phong, Salut, Roland, Thiery, Laurent, Teyssieux, Damien, and Vairac, Pascal. Wed . "Scanning thermal microscopy based on a quartz tuning fork and a micro-thermocouple in active mode (2ω method)". United States. doi:10.1063/1.4952958.
@article{osti_22597975,
title = {Scanning thermal microscopy based on a quartz tuning fork and a micro-thermocouple in active mode (2ω method)},
author = {Bontempi, Alexia and Nguyen, Tran Phong and Salut, Roland and Thiery, Laurent and Teyssieux, Damien and Vairac, Pascal},
abstractNote = {A novel probe for scanning thermal microscope using a micro-thermocouple probe placed on a Quartz Tuning Fork (QTF) is presented. Instead of using an external deflection with a cantilever beam for contact detection, an original combination of piezoelectric resonator and thermal probe is employed. Due to a non-contact photothermal excitation principle, the high quality factor of the QTF allows the probe-to-surface contact detection. Topographic and thermal scanning images obtained on a specific sample points out the interest of our system as an alternative to cantilevered resistive probe systems which are the most spread.},
doi = {10.1063/1.4952958},
journal = {Review of Scientific Instruments},
number = 6,
volume = 87,
place = {United States},
year = {Wed Jun 15 00:00:00 EDT 2016},
month = {Wed Jun 15 00:00:00 EDT 2016}
}
  • This paper introduces a nanopipette combined with a quartz tuning fork-atomic force microscope system (nanopipette/QTF-AFM), and describes experimental and theoretical investigations of the nanoscale materials used. The system offers several advantages over conventional cantilever-based AFM and QTF-AFM systems, including simple control of the quality factor based on the contact position of the QTF, easy variation of the effective tip diameter, electrical detection, on-demand delivery and patterning of various solutions, and in situ surface characterization after patterning. This tool enables nanoscale liquid delivery and nanofabrication processes without damaging the apex of the tip in various environments, and also offers force spectroscopymore » and microscopy capabilities.« less
  • A photo-thermal excitation of a Quartz Tuning Fork (QTF) for topographic studies is introduced. The non-invasive photo-thermal excitation presents practical advantages compared to QTF mechanical and electrical excitations, including the absence of the anti-resonance and its associated phase rotation. Comparison between our theoretical model and experiments validate that the optical transduction mechanism is a photo-thermal rather than photo-thermoacoustic phenomenon. Topographic maps in the context of near-field microscopy distance control have been achieved to demonstrate the performance of the system.
  • Based on a two-prong type quartz tuning fork, a force sensor with a high Q factor, which we call a retuned fork sensor, was developed for non-contact atomic force microscopy (nc-AFM) with atomic resolution. By cutting a small notch and attaching an AFM tip to one prong, its resonance frequency can be retuned to that of the other intact prong. In balancing the two prongs in this manner, a high Q factor (>50 000 in ultrahigh vacuum) is obtained for the sensor. An atomic resolution image of the Si(111)-7 × 7 surface was demonstrated using an nc-AFM with the sensor. The dependence ofmore » the Q factor on resonance frequency of the sensor and the long-range force between tip and sample were measured and analyzed in view of the various dissipation channels. Dissipation in the signal detection circuit turned out to be mainly limited by the total Q factor of the nc-AFM system.« less
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