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Title: Effects of oxygen partial pressure, deposition temperature, and annealing on the optical response of CdS:O thin films as studied by spectroscopic ellipsometry

Abstract

Ex-situ spectroscopic ellipsometry measurements are made on radio frequency magnetron sputtered oxygenated cadmium sulfide (CdS:O) thin films. Films are deposited onto glass substrates at room temperature and at 270 °C with varying oxygen to total gas flow ratios in the sputtering ambient. Ellipsometric spectra from 0.74 to 5.89 eV are collected before and after annealing at 607 °C to simulate the thermal processes during close-space sublimation of overlying cadmium telluride in that solar cell configuration. Complex dielectric function (ε = ε{sub 1} + iε{sub 2}) spectra are extracted for films as a function of oxygen gas flow ratio, deposition temperature, and post-deposition annealing using a parametric model accounting for critical point transitions and an Urbach tail for sub-band gap absorption. The results suggest an inverse relationship between degree of crystallinity and oxygen gas flow ratio, whereas annealing is shown to increase crystallinity in all samples. Direct band gap energies are determined from the parametric modeling of ε and linear extrapolations of the square of the absorption coefficient. As-deposited samples feature a range of band gap energies whereas annealing is shown to result in gap energies ranging only from 2.40 to 2.45 eV, which is close to typical band gaps for pure cadmium sulfide.

Authors:
; ; ; ;  [1]
  1. Department of Physics & Astronomy and The Wright Center for Photovoltaics Innovation & Commercialization, University of Toledo, Toledo, Ohio 43606 (United States)
Publication Date:
OSTI Identifier:
22597893
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 120; Journal Issue: 1; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ABSORPTION; ANNEALING; CADMIUM SULFIDES; CADMIUM TELLURIDES; DEPOSITION; DEPOSITS; DIELECTRIC MATERIALS; ELLIPSOMETRY; EXTRAPOLATION; GAS FLOW; MAGNETRONS; OXYGEN; PARTIAL PRESSURE; RADIOWAVE RADIATION; SOLAR CELLS; SPUTTERING; SUBLIMATION; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS

Citation Formats

Junda, Maxwell M., Grice, Corey R., Subedi, Indra, Yan, Yanfa, and Podraza, Nikolas J. Effects of oxygen partial pressure, deposition temperature, and annealing on the optical response of CdS:O thin films as studied by spectroscopic ellipsometry. United States: N. p., 2016. Web. doi:10.1063/1.4955076.
Junda, Maxwell M., Grice, Corey R., Subedi, Indra, Yan, Yanfa, & Podraza, Nikolas J. Effects of oxygen partial pressure, deposition temperature, and annealing on the optical response of CdS:O thin films as studied by spectroscopic ellipsometry. United States. doi:10.1063/1.4955076.
Junda, Maxwell M., Grice, Corey R., Subedi, Indra, Yan, Yanfa, and Podraza, Nikolas J. Thu . "Effects of oxygen partial pressure, deposition temperature, and annealing on the optical response of CdS:O thin films as studied by spectroscopic ellipsometry". United States. doi:10.1063/1.4955076.
@article{osti_22597893,
title = {Effects of oxygen partial pressure, deposition temperature, and annealing on the optical response of CdS:O thin films as studied by spectroscopic ellipsometry},
author = {Junda, Maxwell M. and Grice, Corey R. and Subedi, Indra and Yan, Yanfa and Podraza, Nikolas J.},
abstractNote = {Ex-situ spectroscopic ellipsometry measurements are made on radio frequency magnetron sputtered oxygenated cadmium sulfide (CdS:O) thin films. Films are deposited onto glass substrates at room temperature and at 270 °C with varying oxygen to total gas flow ratios in the sputtering ambient. Ellipsometric spectra from 0.74 to 5.89 eV are collected before and after annealing at 607 °C to simulate the thermal processes during close-space sublimation of overlying cadmium telluride in that solar cell configuration. Complex dielectric function (ε = ε{sub 1} + iε{sub 2}) spectra are extracted for films as a function of oxygen gas flow ratio, deposition temperature, and post-deposition annealing using a parametric model accounting for critical point transitions and an Urbach tail for sub-band gap absorption. The results suggest an inverse relationship between degree of crystallinity and oxygen gas flow ratio, whereas annealing is shown to increase crystallinity in all samples. Direct band gap energies are determined from the parametric modeling of ε and linear extrapolations of the square of the absorption coefficient. As-deposited samples feature a range of band gap energies whereas annealing is shown to result in gap energies ranging only from 2.40 to 2.45 eV, which is close to typical band gaps for pure cadmium sulfide.},
doi = {10.1063/1.4955076},
journal = {Journal of Applied Physics},
number = 1,
volume = 120,
place = {United States},
year = {Thu Jul 07 00:00:00 EDT 2016},
month = {Thu Jul 07 00:00:00 EDT 2016}
}
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