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Title: A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)

Abstract

A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu K{sub α1} line. To demonstrate the performance of the spectrometer under high-power conditions, K{sub α1,2} emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 10{sup 18} W/cm{sup 2}. The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ; ;  [1];  [1]; ; ;  [2];
  1. Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623-1299 (United States)
  2. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543-0451 (United States)
Publication Date:
OSTI Identifier:
22596448
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 11; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CHARGE-COUPLED DEVICES; CRYSTALS; EMISSION; EMISSION SPECTRA; FOILS; IRRADIATION; KEV RANGE 01-10; LASERS; PULSES; SPHERICAL CONFIGURATION; STREAK CAMERAS; X RADIATION; X-RAY SPECTRA; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY

Citation Formats

Nilson, P. M., E-mail: pnil@lle.rochester.edu, Ehrne, F., Mileham, C., Mastrosimone, D., Jungquist, R. K., Taylor, C., Stillman, C. R., Ivancic, S. T., Boni, R., Hassett, J., Lonobile, D. J., Kidder, R. W., Shoup, M. J., Solodov, A. A., Stoeckl, C., Theobald, W., Froula, D. H., Department of Physics and Astronomy, University of Rochester, Rochester, New York 14627, Hill, K. W., Gao, L., Bitter, M., and others, and. A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited). United States: N. p., 2016. Web. doi:10.1063/1.4961076.
Nilson, P. M., E-mail: pnil@lle.rochester.edu, Ehrne, F., Mileham, C., Mastrosimone, D., Jungquist, R. K., Taylor, C., Stillman, C. R., Ivancic, S. T., Boni, R., Hassett, J., Lonobile, D. J., Kidder, R. W., Shoup, M. J., Solodov, A. A., Stoeckl, C., Theobald, W., Froula, D. H., Department of Physics and Astronomy, University of Rochester, Rochester, New York 14627, Hill, K. W., Gao, L., Bitter, M., & others, and. A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited). United States. doi:10.1063/1.4961076.
Nilson, P. M., E-mail: pnil@lle.rochester.edu, Ehrne, F., Mileham, C., Mastrosimone, D., Jungquist, R. K., Taylor, C., Stillman, C. R., Ivancic, S. T., Boni, R., Hassett, J., Lonobile, D. J., Kidder, R. W., Shoup, M. J., Solodov, A. A., Stoeckl, C., Theobald, W., Froula, D. H., Department of Physics and Astronomy, University of Rochester, Rochester, New York 14627, Hill, K. W., Gao, L., Bitter, M., and others, and. Tue . "A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)". United States. doi:10.1063/1.4961076.
@article{osti_22596448,
title = {A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)},
author = {Nilson, P. M., E-mail: pnil@lle.rochester.edu and Ehrne, F. and Mileham, C. and Mastrosimone, D. and Jungquist, R. K. and Taylor, C. and Stillman, C. R. and Ivancic, S. T. and Boni, R. and Hassett, J. and Lonobile, D. J. and Kidder, R. W. and Shoup, M. J. and Solodov, A. A. and Stoeckl, C. and Theobald, W. and Froula, D. H. and Department of Physics and Astronomy, University of Rochester, Rochester, New York 14627 and Hill, K. W. and Gao, L. and Bitter, M. and others, and},
abstractNote = {A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu K{sub α1} line. To demonstrate the performance of the spectrometer under high-power conditions, K{sub α1,2} emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 10{sup 18} W/cm{sup 2}. The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.},
doi = {10.1063/1.4961076},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 11,
volume = 87,
place = {United States},
year = {2016},
month = {11}
}