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Title: Implementation of the new multichannel X-mode edge density profile reflectometer for the ICRF antenna on ASDEX Upgrade

Abstract

A new multichannel frequency modulated continuous-wave reflectometry diagnostic has been successfully installed and commissioned on ASDEX Upgrade to measure the plasma edge electron density profile evolution in front of the Ion Cyclotron Range of Frequencies (ICRF) antenna. The design of the new three-strap ICRF antenna integrates ten pairs (sending and receiving) of microwave reflectometry antennas. The multichannel reflectometer can use three of these to measure the edge electron density profiles up to 2 × 10{sup 19} m{sup −3}, at different poloidal locations, allowing the direct study of the local plasma layers in front of the ICRF antenna. ICRF power coupling, operational effects, and poloidal variations of the plasma density profile can be consistently studied for the first time. In this work the diagnostic hardware architecture is described and the obtained density profile measurements were used to track outer radial plasma position and plasma shape.

Authors:
; ; ; ; ; ; ; ;  [1]; ; ; ;  [2]; ;  [3]; ; ;  [4];
  1. Instituto de Plasmas e Fusão Nuclear, Instituto Superior Técnico, Universidade de Lisboa, 1049-001 Lisboa (Portugal)
  2. Max-Planck-Institut für Plasmaphysik, Boltzmannstr. 2, D-85748 Garching (Germany)
  3. Consorzio RFX (CNR, ENEA, INFN, Universitá di Padova, Acciaierie Venete SpA), Corso Stati Uniti 4, 35127 Padova (Italy)
  4. ENEA, Dipartimento FSN, C. R. Frascati, Via E. Fermi 45, 00044 Frascati, Roma (Italy)
Publication Date:
OSTI Identifier:
22596439
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 11; Other Information: (c) 2016 EURATOM; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; ANTENNAS; ASDEX TOKAMAK; CYCLOTRONS; ELECTRON DENSITY; ICR HEATING; IMPLEMENTATION; ION CYCLOTRON-RESONANCE; LAYERS; MICROWAVE RADIATION; PARTICLE TRACKS; PLASMA DENSITY

Citation Formats

Aguiam, D. E., E-mail: daguiam@ipfn.tecnico.ulisboa.pt, Silva, A., Carvalho, P. J., Carvalho, P. F., Fernandes, A., Gonçalves, B., Guimarais, L., Meneses, L., Pereira, R. C., Santos, J. M., Bobkov, V., Conway, G. D., Faugel, H., Fünfgelder, H., Cavazzana, R., De Masi, G., D’Arcangelo, O., Rocchi, G., Tuccillo, A. A., and others, and. Implementation of the new multichannel X-mode edge density profile reflectometer for the ICRF antenna on ASDEX Upgrade. United States: N. p., 2016. Web. doi:10.1063/1.4961558.
Aguiam, D. E., E-mail: daguiam@ipfn.tecnico.ulisboa.pt, Silva, A., Carvalho, P. J., Carvalho, P. F., Fernandes, A., Gonçalves, B., Guimarais, L., Meneses, L., Pereira, R. C., Santos, J. M., Bobkov, V., Conway, G. D., Faugel, H., Fünfgelder, H., Cavazzana, R., De Masi, G., D’Arcangelo, O., Rocchi, G., Tuccillo, A. A., & others, and. Implementation of the new multichannel X-mode edge density profile reflectometer for the ICRF antenna on ASDEX Upgrade. United States. doi:10.1063/1.4961558.
Aguiam, D. E., E-mail: daguiam@ipfn.tecnico.ulisboa.pt, Silva, A., Carvalho, P. J., Carvalho, P. F., Fernandes, A., Gonçalves, B., Guimarais, L., Meneses, L., Pereira, R. C., Santos, J. M., Bobkov, V., Conway, G. D., Faugel, H., Fünfgelder, H., Cavazzana, R., De Masi, G., D’Arcangelo, O., Rocchi, G., Tuccillo, A. A., and others, and. Tue . "Implementation of the new multichannel X-mode edge density profile reflectometer for the ICRF antenna on ASDEX Upgrade". United States. doi:10.1063/1.4961558.
@article{osti_22596439,
title = {Implementation of the new multichannel X-mode edge density profile reflectometer for the ICRF antenna on ASDEX Upgrade},
author = {Aguiam, D. E., E-mail: daguiam@ipfn.tecnico.ulisboa.pt and Silva, A. and Carvalho, P. J. and Carvalho, P. F. and Fernandes, A. and Gonçalves, B. and Guimarais, L. and Meneses, L. and Pereira, R. C. and Santos, J. M. and Bobkov, V. and Conway, G. D. and Faugel, H. and Fünfgelder, H. and Cavazzana, R. and De Masi, G. and D’Arcangelo, O. and Rocchi, G. and Tuccillo, A. A. and others, and},
abstractNote = {A new multichannel frequency modulated continuous-wave reflectometry diagnostic has been successfully installed and commissioned on ASDEX Upgrade to measure the plasma edge electron density profile evolution in front of the Ion Cyclotron Range of Frequencies (ICRF) antenna. The design of the new three-strap ICRF antenna integrates ten pairs (sending and receiving) of microwave reflectometry antennas. The multichannel reflectometer can use three of these to measure the edge electron density profiles up to 2 × 10{sup 19} m{sup −3}, at different poloidal locations, allowing the direct study of the local plasma layers in front of the ICRF antenna. ICRF power coupling, operational effects, and poloidal variations of the plasma density profile can be consistently studied for the first time. In this work the diagnostic hardware architecture is described and the obtained density profile measurements were used to track outer radial plasma position and plasma shape.},
doi = {10.1063/1.4961558},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 11,
volume = 87,
place = {United States},
year = {2016},
month = {11}
}