Semiconductor- to metallic-like behavior in Bi thin films on KCl substrate

Journal Article · Thu Apr 07 00:00:00 EDT 2016 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4945036· OSTI ID:22594564

Bui, Thanh Nhan ^[1]; Raskin, Jean-Pierre ^[2]; Hackens, Benoit ^[1]

---

1. IMCN/NAPS, Université catholique de Louvain, Louvain-la-Neuve (Belgium)
2. ICTEAM/ELEN, Université catholique de Louvain, Louvain-la-Neuve (Belgium)

Bi thin films, with a thickness of 100 nm, are deposited by electron-beam evaporation on a freshly cleaved (100) KCl substrate. The substrate temperature during film growth (T{sub dep}) ranges from room temperature up to 170 °C. Films deposited at room temperature exhibit a maze-like microstructure typical of the rhombohedral (110) texture, as confirmed by X-ray diffraction. For T{sub dep} above 80 °C, a different microstructure appears, characterized by concentric triangular shapes corresponding to the trigonal (111) texture. Temperature dependence of the resistivity shows a transition from a semiconductor-like behavior for films deposited at room temperature to a metallic-like behavior for T{sub dep} above 80 °C. From magnetoresistance measurements between room temperature and 1.6 K, we extract the electron and hole mobilities, concentrations, and mean free paths, which allow to draw a complete picture of the transport properties of both types of films.

• OSTI ID: 22594564
• Journal Information: Journal of Applied Physics, Vol. 119, Issue 13; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CONCENTRATION RATIO
DEPOSITS
ELECTRON BEAMS
ELECTRONS
EVAPORATION
HOLE MOBILITY
MAGNETORESISTANCE
MEAN FREE PATH
MICROSTRUCTURE
POTASSIUM CHLORIDES
SEMICONDUCTOR MATERIALS
SUBSTRATES
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0273-0400 K
TEXTURE
THICKNESS
THIN FILMS
TRANSPORT THEORY
TRIGONAL LATTICES
X-RAY DIFFRACTION