Infrared dielectric function of polydimethylsiloxane and selective emission behavior

Journal Article · Mon Aug 08 00:00:00 EDT 2016 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4961051· OSTI ID:22594345

Srinivasan, Arvind; Czapla, Braden; Narayanaswamy, Arvind ^[1]; Mayo, Jeff ^[2]

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1. Department of Mechanical Engineering, Columbia University, New York, New York 10027 (United States)
2. Skycatch, San Francisco, California 94107 (United States)

The complex refractive index of polydimethylsiloxane (PDMS) is determined in the wavelength range between 2.5 μm and 16.7 μm. The parameters of a Drude-Lorentz oscillator model (with 15 oscillators) are extracted from Fourier transform infrared spectroscopy reflectance measurements made on both bulk PDMS and thin films of PDMS deposited on the gold coated silicon substrates. It is shown that thin films of PDMS atop gold exhibit selective emission in the 8 μm to 13 μm atmospheric transmittance window, which demonstrates that PDMS, especially due to its ease of deposition, may be a viable material for passive radiative cooling applications.

• OSTI ID: 22594345
• Journal Information: Applied Physics Letters, Vol. 109, Issue 6; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
DEPOSITION
DEPOSITS
DIELECTRIC MATERIALS
EMISSION
FOURIER TRANSFORM SPECTROMETERS
FOURIER TRANSFORMATION
GOLD
OSCILLATORS
RADIATIVE COOLING
REFRACTIVE INDEX
SILICON
SILOXANES
SUBSTRATES
THIN FILMS
WAVELENGTHS