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Title: Atomic bonding effects in annular dark field scanning transmission electron microscopy. II. Experiments

Abstract

Quantitatively calibrated annular dark field scanning transmission electron microscopy (ADF-STEM) imaging experiments were compared to frozen phonon multislice simulations adapted to include chemical bonding effects. Having carefully matched simulation parameters to experimental conditions, a depth-dependent bonding effect was observed for high-angle ADF-STEM imaging of aluminum nitride. This result is explained by computational predictions, systematically examined in the preceding portion of this study, showing the propagation of the converged STEM beam to be highly sensitive to net interatomic charge transfer. Thus, although uncertainties in experimental conditions and simulation accuracy remain, the computationally predicted experimental bonding effect withstands the experimental testing reported here.

Authors:
; ;  [1]
  1. Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455 (United States)
Publication Date:
OSTI Identifier:
22592863
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films; Journal Volume: 34; Journal Issue: 4; Other Information: (c) 2016 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; ACCURACY; ALUMINIUM NITRIDES; BEAMS; BONDING; CHEMICAL BONDS; COMPARATIVE EVALUATIONS; DEPTH; FORECASTING; PHONONS; TESTING; TRANSMISSION ELECTRON MICROSCOPY

Citation Formats

Odlyzko, Michael L., Held, Jacob T., and Mkhoyan, K. Andre, E-mail: mkhoyan@umn.edu. Atomic bonding effects in annular dark field scanning transmission electron microscopy. II. Experiments. United States: N. p., 2016. Web. doi:10.1116/1.4954877.
Odlyzko, Michael L., Held, Jacob T., & Mkhoyan, K. Andre, E-mail: mkhoyan@umn.edu. Atomic bonding effects in annular dark field scanning transmission electron microscopy. II. Experiments. United States. doi:10.1116/1.4954877.
Odlyzko, Michael L., Held, Jacob T., and Mkhoyan, K. Andre, E-mail: mkhoyan@umn.edu. Fri . "Atomic bonding effects in annular dark field scanning transmission electron microscopy. II. Experiments". United States. doi:10.1116/1.4954877.
@article{osti_22592863,
title = {Atomic bonding effects in annular dark field scanning transmission electron microscopy. II. Experiments},
author = {Odlyzko, Michael L. and Held, Jacob T. and Mkhoyan, K. Andre, E-mail: mkhoyan@umn.edu},
abstractNote = {Quantitatively calibrated annular dark field scanning transmission electron microscopy (ADF-STEM) imaging experiments were compared to frozen phonon multislice simulations adapted to include chemical bonding effects. Having carefully matched simulation parameters to experimental conditions, a depth-dependent bonding effect was observed for high-angle ADF-STEM imaging of aluminum nitride. This result is explained by computational predictions, systematically examined in the preceding portion of this study, showing the propagation of the converged STEM beam to be highly sensitive to net interatomic charge transfer. Thus, although uncertainties in experimental conditions and simulation accuracy remain, the computationally predicted experimental bonding effect withstands the experimental testing reported here.},
doi = {10.1116/1.4954877},
journal = {Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films},
number = 4,
volume = 34,
place = {United States},
year = {Fri Jul 15 00:00:00 EDT 2016},
month = {Fri Jul 15 00:00:00 EDT 2016}
}