Depth resolved domain mapping in tetragonal SrTiO{sub 3} by micro-Laue diffraction

Journal Article · Mon May 02 00:00:00 EDT 2016 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4948351· OSTI ID:22591675

Inoue, H. ^[1]; Noad, H.; Hikita, Y.; Vailionis, A.; Moler, K. A.; Hwang, H. Y. ^[1]; Xu, R.; Liu, W. ^[2]

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1. Geballe Laboratory for Advanced Materials, Department of Applied Physics, Stanford University, Stanford, California 94305 (United States)
2. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO{sub 3}. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x- and z-axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.

• OSTI ID: 22591675
• Journal Information: Applied Physics Letters, Vol. 108, Issue 18; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DOMAIN STRUCTURE
MAPPING
MONOCHROMATIC RADIATION
STRAINS
STRONTIUM TITANATES
SURFACES
WIDTH
X-RAY DIFFRACTION