Structural and magnetic studies of tin doped α-Fe{sub 2}O{sub 3} (α-Sn{sub x}Fe{sub 2-x}O{sub 3}) nanoparticles prepared by microwave assisted synthesis
- Nanomaterials Research Laboratory, Surface Engineering Division, National Aerospace Laboratories, Council of Scientific and Industrial Research, Bangalore-560 017, Karnataka (India)
- Computational Physics Laboratory, Department of Physics, National Institute of Technology Karnataka, Surathkal, Srinivasnagar, Mangalore-575 025, Karnataka (India)
Hematite (α-Fe{sub 2}O{sub 3}) doped with tetravalent ions have potential applications in various fields such as gas sensors, memories, energy storage devices because of their electrical and magnetic properties. Microwave assisted synthesis was used to prepare Tin doped α-Fe{sub 2}O{sub 3} [α-Sn{sub x}Fe{sub 2-x}O{sub 3}]. The structural and morphological studies were investigated using X-ray diffraction (XRD) and Scanning electron microscopy (SEM). XRD patterns revealed that α-Fe{sub 2}O{sub 3} and α-Sn{sub x}Fe{sub 2-x}O{sub 3} were having rhombohedral structure. The compositional study was done by Energy dispersive X-ray Spectroscopy (EDS). The magnetic properties were studied by Vibrating Sample Magnetometry (VSM). Results shows that the prepared samples were found to be antiferromagnetic in nature and the results are discussed in detail.
- OSTI ID:
- 22591397
- Journal Information:
- AIP Conference Proceedings, Vol. 1728, Issue 1; Conference: ICC 2015: International conference on condensed matter and applied physics, Bikaner (India), 30-31 Oct 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ANTIFERROMAGNETIC MATERIALS
ANTIFERROMAGNETISM
CRYSTAL GROWTH
DOPED MATERIALS
FERRATES
HEMATITE
IRON OXIDES
MAGNETIC PROPERTIES
MICROWAVE RADIATION
NANOPARTICLES
SCANNING ELECTRON MICROSCOPY
SENSORS
SYNTHESIS
TIN COMPOUNDS
TRIGONAL LATTICES
VIBRATING SAMPLE MAGNETOMETERS
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY