The Boersch effect in a picosecond pulsed electron beam emitted from a semiconductor photocathode
- Institute of Materials and Systems for Sustainability, Nagoya University, Nagoya 464-8603 (Japan)
- Graduate School of Engineering, Nagoya University, Nagoya 464-8603 (Japan)
- High Energy Accelerator Research Organization (KEK), Tsukuba 305-0801 (Japan)
- Aichi Synchrotron Radiation Center, Seto 489-0965 (Japan)
The space charge effect has been clearly observed in the energy distributions of picosecond pulse beams from a spin-polarized electron microscope, and was found to depend upon the quantity of charge per pulse. The non-linear phenomena associated with this effect have also been replicated in beam simulations that take into account of a three-dimensional space charge. The results show that a charge of 500 aC/pulse provides the highest brightness with a 16-ps pulse duration, a 30-keV beam energy, and an emission spot of 1.8 μm. Furthermore, the degeneracy of the wave packet of the pulsed electron beam has been evaluated to be 1.6 × 10{sup −5} with a charge of 100 aC/pulse, which is higher than that for a continuously emitted electron beam despite the low beam energy of 30 keV. The high degeneracy and high brightness contribute to the realization of high temporal and energy resolutions in low-voltage electron microscopy, which will serve to reduce radiolysis damage and enhance scattering contrast.
- OSTI ID:
- 22590582
- Journal Information:
- Applied Physics Letters, Vol. 109, Issue 1; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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