Crystal growth of Bi{sub 2}Te{sub 3} and noble cleaved (0001) surface properties

Journal Article · Fri Apr 15 00:00:00 EDT 2016 · Journal of Solid State Chemistry

DOI:https://doi.org/10.1016/J.JSSC.2015.07.031· OSTI ID:22584042

Golyashov, V. A. ^[1]; Kokh, K. A. ^[2]; Korolkov, I. V. ^[3]; Kozhukhov, A. S. ^[3]; Kruchinin, V. N. ^[4]; Loshkarev, I. D. ^[5]; Pokrovsky, L. D. ^[6]; Prosvirin, I. P. ^[3]; others, and

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1. Laboratory of Molecular Beam Epitaxy of III-V Semiconductors, Institute of Semiconductor Physics, SB RAS, Novosibirsk 630090 (Russian Federation)
2. Laboratory of Crystal Growth, Institute of Geology and Mineralogy, SB RAS, Novosibirsk 630090 (Russian Federation)
3. Novosibirsk State University, Novosibirsk 630090 (Russian Federation)
4. Laboratory for Ellipsometry of Semiconductor Materials and Structures, Institute of Semiconductor Physics, SB RAS, Novosibirsk 630090 (Russian Federation)
5. Laboratory of Molecular Beam Epitaxy of Elementary Semiconductors and A3B5 Compounds, Institute of Semiconductor Physics, SB RAS, Novosibirsk 630090 (Russian Federation)
6. Laboratory of Optical Materials and Structures, Institute of Semiconductor Physics, SB RAS, Novosibirsk 630090 (Russian Federation)

A high quality Bi{sub 2}Te{sub 3} crystal has been grown by Bridgman method with the use of rotating heat field. The phase purity and bulk structural quality of the crystal have been verified by XRD analysis and rocking curve observation. The atomically smooth Bi{sub 2}Te{sub 3}(0001) surface with an excellent crystallographic quality is formed by cleavage in the air. The chemical and microstructural properties of the surface have been evaluated with RHEED, AFM, STM, SE and XPS. The Bi{sub 2}Te{sub 3}(0001) cleaved surface is formed by atomically smooth terraces with the height of the elemental step of ~1.04±0.1 nm, as estimated by AFM. There is no surface oxidation process detected over a month keeping in the air at normal conditions, as shown by comparative core level photoelectron spectroscopy. - Graphical abstract: A high quality Bi{sub 2}Te{sub 3} crystal has been grown by Bridgman method with the use of rotating heat field and the Bi{sub 2}Te{sub 3}(0001) cleaved surface has been evaluated with RHEED, AFM, STM, SE and XPS. - Highlights: • High-quality Bi{sub 2}Te{sub 3} crystal of 10 mm in diameter and 50 mm long have been grown. • The high-purity cleaved Bi{sub 2}Te{sub 3}(0001) surface has been evaluated by RHEED, AFM, STM and XPS methods. • The Bi{sub 2}Te{sub 3} surface covered by atomically smooth (0001) terraces is chemically stable for a long time.

• OSTI ID: 22584042
• Journal Information: Journal of Solid State Chemistry, Vol. 236; Other Information: Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ATOMIC FORCE MICROSCOPY
BISMUTH SELENIDES
BISMUTH TELLURIDES
BRIDGMAN METHOD
CLEAVAGE
CRYSTALLOGRAPHY
CRYSTALS
ELECTRON DIFFRACTION
IMPURITIES
NEUTRON DIFFRACTION
OXIDATION
SCANNING TUNNELING MICROSCOPY
SURFACE PROPERTIES
SURFACES
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY