Three-dimensional super-resolution imaging for fluorescence emission difference microscopy

Journal Article · Sat Aug 15 00:00:00 EDT 2015 · AIP Advances

DOI:https://doi.org/10.1063/1.4915132· OSTI ID:22584033

You, Shangting; Kuang, Cuifang; Li, Shuai; Liu, Xu; Ding, Zhihua ^[1]

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1. State key laboratory of modern optical instrumentations, Zhejiang University, Hangzhou 310027 (China)

We propose a method theoretically to break the diffraction limit and to improve the resolution in all three dimensions for fluorescence emission difference microscopy. We produce two kinds of hollow focal spot by phase modulation. By incoherent superposition, these two kinds of focal spot yield a 3D hollow focal spot. The optimal proportion of these two kinds of spot is given in the paper. By employing 3D hollow focal spot, super-resolution image can be yielded by means of fluorescence emission difference microscopy, with resolution enhanced both laterally and axially. According to computation result, size of point spread function of three-dimensional super-resolution imaging is reduced by about 40% in all three spatial directions with respect to confocal imaging.

• OSTI ID: 22584033
• Journal Information: AIP Advances, Vol. 5, Issue 8; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DIFFRACTION
FLUORESCENCE
MICROSCOPY
YIELDS