A comparative study on CdS: PEO and CdS: PMMA nanocomposite solid films

Journal Article · Mon Aug 15 00:00:00 EDT 2016 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2016.03.026· OSTI ID:22581583

Padmaja, S. ^[1]; Balaji, R.; Vaideki, K. ^[1]

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1. Thin film centre, PSG College of Technology, Coimbatore (India)

Cadmium Sulphide (CdS) nanoparticles were reinforced in Poly(ethylene Oxide) (PEO) and Poly(methyl methacrylate) (PMMA) matrices by in situ technique. The presence of CdS in PEO and PMMA matrix was confirmed using X-ray photoelectron spectroscopy (XPS). Fourier Transform Infrared spectroscopy (FTIR) analysis disclosed the co-ordination of CdS in the matrices. Thermal analysis of the nanocomposites was carried out using Differential Scanning calorimetric studies (DSC). The optical studies using UV–vis spectroscopy were carried out to find the band gap of the materials and the absorption onset. The CdS particle size in the matrices was found by Effective Mass Approximation (EMA) model using the band gap values and was confirmed by TEM studies. The surface trapped emissions of the nanocomposites were observed from the photoluminescence (PL) spectra. The distribution of CdS particles in the polymer matrices were presented by Atomic force microscopic studies (AFM).

• OSTI ID: 22581583
• Journal Information: Materials Research Bulletin, Vol. 80; Other Information: Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
ATOMIC FORCE MICROSCOPY
CADMIUM SULFIDES
CALORIMETRY
EFFECTIVE MASS
ENERGY GAP
ETHYLENE
FOURIER TRANSFORMATION
INFRARED SPECTRA
METHACRYLIC ACID ESTERS
NANOCOMPOSITES
NANOPARTICLES
PARTICLE SIZE
PHOTOLUMINESCENCE
PLASMA SWITCHES
PMMA
SEMICONDUCTOR MATERIALS
THERMAL ANALYSIS
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY PHOTOELECTRON SPECTROSCOPY