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Title: Investigation of optical properties of multilayer dielectric structures using prism-coupling technique

Abstract

A method based on resonant excitation of waveguide modes with a prism coupler is proposed for measuring the thickness and refractive index of thin-film layers in multilayer dielectric structures. The peculiarities of reflection of TE- and TM-polarised light beams from a structure comprising eleven alternating layers of zinc sulfide (ZnS) and magnesium barium fluoride (MgBaF{sub 4}), whose thicknesses are much less than the wavelength of light, are investigated. Using the mathematical model developed, we have calculated the coefficients of reflection of collimated TE and TM light beams from a multilayer structure and determined the optical constants and thicknesses of the structure layers. The refractive indices of the layers, obtained for TE and TM polarisation of incident light, are in good agreement. The thicknesses of ZnS and MgBaF{sub 4} layers, found for different polarisations, coincide with an accuracy of ±1%. Thus, we have demonstrated for the first time that the prism-coupling technique allows one to determine the optical properties of thin-film structures when the number of layers in the structure exceeds ten layers. (integrated optics)

Authors:
; ; ; ; ;  [1]
  1. Institute on Laser and Information Technologies, Russian Academy of Sciences, Shatura, Moscow Region (Russian Federation)
Publication Date:
OSTI Identifier:
22551185
Resource Type:
Journal Article
Journal Name:
Quantum Electronics (Woodbury, N.Y.)
Additional Journal Information:
Journal Volume: 45; Journal Issue: 9; Other Information: Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7818
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; BARIUM FLUORIDES; DIELECTRIC MATERIALS; EXCITATION; LAYERS; MAGNESIUM COMPOUNDS; MATHEMATICAL MODELS; PHOTON BEAMS; POLARIZATION; PRISMS; REFLECTION; REFRACTIVE INDEX; THIN FILMS; VISIBLE RADIATION; WAVEGUIDES; WAVELENGTHS; ZINC SULFIDES

Citation Formats

Sokolov, V I, Glebov, V N, Malyutin, A M, Molchanova, S I, Khaydukov, E V, and Panchenko, V Ya. Investigation of optical properties of multilayer dielectric structures using prism-coupling technique. United States: N. p., 2015. Web. doi:10.1070/QE2015V045N09ABEH015852.
Sokolov, V I, Glebov, V N, Malyutin, A M, Molchanova, S I, Khaydukov, E V, & Panchenko, V Ya. Investigation of optical properties of multilayer dielectric structures using prism-coupling technique. United States. doi:10.1070/QE2015V045N09ABEH015852.
Sokolov, V I, Glebov, V N, Malyutin, A M, Molchanova, S I, Khaydukov, E V, and Panchenko, V Ya. Wed . "Investigation of optical properties of multilayer dielectric structures using prism-coupling technique". United States. doi:10.1070/QE2015V045N09ABEH015852.
@article{osti_22551185,
title = {Investigation of optical properties of multilayer dielectric structures using prism-coupling technique},
author = {Sokolov, V I and Glebov, V N and Malyutin, A M and Molchanova, S I and Khaydukov, E V and Panchenko, V Ya},
abstractNote = {A method based on resonant excitation of waveguide modes with a prism coupler is proposed for measuring the thickness and refractive index of thin-film layers in multilayer dielectric structures. The peculiarities of reflection of TE- and TM-polarised light beams from a structure comprising eleven alternating layers of zinc sulfide (ZnS) and magnesium barium fluoride (MgBaF{sub 4}), whose thicknesses are much less than the wavelength of light, are investigated. Using the mathematical model developed, we have calculated the coefficients of reflection of collimated TE and TM light beams from a multilayer structure and determined the optical constants and thicknesses of the structure layers. The refractive indices of the layers, obtained for TE and TM polarisation of incident light, are in good agreement. The thicknesses of ZnS and MgBaF{sub 4} layers, found for different polarisations, coincide with an accuracy of ±1%. Thus, we have demonstrated for the first time that the prism-coupling technique allows one to determine the optical properties of thin-film structures when the number of layers in the structure exceeds ten layers. (integrated optics)},
doi = {10.1070/QE2015V045N09ABEH015852},
journal = {Quantum Electronics (Woodbury, N.Y.)},
issn = {1063-7818},
number = 9,
volume = 45,
place = {United States},
year = {2015},
month = {9}
}