Structural and magnetic properties of pure and Cu doped In{sub 2}O{sub 3} thin films

Journal Article · Wed Jun 24 00:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4918158· OSTI ID:22490559

Krishna, N. Sai; Rao, N. Madhusudhana; Krishnamoorthi, C.; Begam, M. Rigana ^[1]; Amarendra, G. ^[2]

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1. Thin Films Laboratory, School of Advanced Sciences, VIT University, Vellore – 632014 (India)
2. Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam –603102 (India)

Pure and Cu (7 at.%) doped In{sub 2}O{sub 3} thin films were prepared using an electron beam evaporation technique. A systematic study was carried out on the structural, chemical and magnetic properties of the thin films. X-ray diffraction analysis revealed that all the films were cubic in structure. The pure and Cu doped In{sub 2}O{sub 3} thin films showed ferromagnetism at room temperature. The Cu doped In{sub 2}O{sub 3} thin films showed the saturation magnetization, coercivity and retentivity of 38.71 emu/cm{sup 3}, 245 G and 5.54 emu/cm{sup 3}, respectively.

• OSTI ID: 22490559
• Journal Information: AIP Conference Proceedings, Vol. 1665, Issue 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COERCIVE FORCE
COPPER
DOPED MATERIALS
ELECTRON BEAMS
EVAPORATION
FERROMAGNETISM
INDIUM OXIDES
MAGNETIC PROPERTIES
MAGNETIZATION
SATURATION
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
X-RAY DIFFRACTION