Microstructural, optical and dielectric properties of La{sub 0.8}Ba{sub 0.2}FeO{sub 3} nanostructures synthesized by sol-gel combustion method
Journal Article
·
· AIP Conference Proceedings
- Centre of Excellence in Materials Science (Nanomaterials), Department of Applied Physics, Z.H. College of Engg. & Technology, Aligarh Muslim University, Aligarh 202002 (India)
- Department of Electrical Engineering, Aligarh Muslim University, Aligarh-202002 (India)
Barium doped lanthanum ferrite (LaFeO{sub 3}) nanoparticles (NPs) were prepared by gel combustion method and calcinated at 700°C. Microstructural studies were carried by XRD and SEM techniques. The results of structural characterization show the formation of all samples in single phase without any impurity. Optical properties were studied by UV- visible technique. The energy band gap was calculated and obtained 3.01 eV. Dielectric properties characterized by LCR meter and have been observed appreciable changes. The observed behavior of the dielectric properties can be attributed on the basis of Koop’s theory based on Maxwell-Wagner two layer models in studied nanoparticles.
- OSTI ID:
- 22490284
- Journal Information:
- AIP Conference Proceedings, Vol. 1665, Issue 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BARIUM COMPOUNDS
COMBUSTION
DIELECTRIC PROPERTIES
DOPED MATERIALS
ENERGY GAP
EV RANGE
FERRITES
LANTHANUM COMPOUNDS
LAYERS
MICROSTRUCTURE
NANOPARTICLES
NANOSTRUCTURES
OPTICAL PROPERTIES
SCANNING ELECTRON MICROSCOPY
SOL-GEL PROCESS
X-RAY DIFFRACTION
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BARIUM COMPOUNDS
COMBUSTION
DIELECTRIC PROPERTIES
DOPED MATERIALS
ENERGY GAP
EV RANGE
FERRITES
LANTHANUM COMPOUNDS
LAYERS
MICROSTRUCTURE
NANOPARTICLES
NANOSTRUCTURES
OPTICAL PROPERTIES
SCANNING ELECTRON MICROSCOPY
SOL-GEL PROCESS
X-RAY DIFFRACTION