Three-dimensional spectrum mapping of bright emission centers: Investigating the brightness-limiting process in Eu-doped GaN red light emitting diodes
- National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0047 (Japan)
- Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871 (Japan)
A pulse-driven emission-spectroscopy mapping technique is used to investigate the bright emission centers in Eu-doped GaN (GaN:Eu) red light emitting diodes (LED). The LEDs are operated in pulse-driven mode, and the emission spectra are acquired for a range of pulse frequencies. This ensemble of emission spectral data yields a three-dimensional mapping that allows the origin of emission lines to be identified by visual inspection. The identification was achieved even for a weak {sup 5}D{sub 0} → {sup 7}F{sub 3} transition in conventional photoluminescence measurements. A peculiar split is observed in the {sup 5}D{sub 0} → {sup 7}F{sub 3} transition for the bright emission center referred to as OMVPE 8. Despite the unique transition at this emission center, the emission efficiencies for the {sup 5}D{sub 0} → {sup 7}F{sub 3} and {sup 5}D{sub 0} → {sup 7}F{sub 2} transitions were identical. This finding indicates that the excitation of the emission centers, rather than the radiative transitions, is the limiting process that determines the GaN:Eu red LED brightness.
- OSTI ID:
- 22489155
- Journal Information:
- Applied Physics Letters, Vol. 107, Issue 8; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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