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Title: The comprehensive study and the reduction of contact resistivity on the n-InGaAs M-I-S contact system with different inserted insulators

Abstract

Five different kinds of insulators including BaTiO{sub 3}, TiO{sub 2}, Al{sub 2}O{sub 3}, CdO and ZnO on the n-type InGaAs metal-insulator-semiconductor (M-I-S) ohmic contact structure are studied. The effect for the dielectric constant (ε) of inserted insulator and the conduction band offset (CBO) between an insulator and semiconductor substrate is analyzed by a unified M-I-S contact model. Based on the theoretical model and experimental data, we demonstrates that the inserted ZnO insulator with the high electron affinity and the low CBO (∼0.1 eV) to the InGaAs substrate results in ∼10 times contact resistivity reduction, even the ε of ZnO is not pretty high (∼10)

Authors:
;  [1]
  1. Department of Mechanical Engineering, National Taiwan University, Taipei, 10617 Taiwan, R. O. C. (China)
Publication Date:
OSTI Identifier:
22488576
Resource Type:
Journal Article
Journal Name:
AIP Advances
Additional Journal Information:
Journal Volume: 5; Journal Issue: 5; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 2158-3226
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINIUM OXIDES; CADMIUM OXIDES; GALLIUM ARSENIDES; INDIUM ARSENIDES; METALS; PERMITTIVITY; SUBSTRATES; TITANATES; TITANIUM OXIDES; ZINC OXIDES

Citation Formats

Liao, M.-H., E-mail: mhliaoa@ntu.edu.tw, and Lien, C. The comprehensive study and the reduction of contact resistivity on the n-InGaAs M-I-S contact system with different inserted insulators. United States: N. p., 2015. Web. doi:10.1063/1.4921023.
Liao, M.-H., E-mail: mhliaoa@ntu.edu.tw, & Lien, C. The comprehensive study and the reduction of contact resistivity on the n-InGaAs M-I-S contact system with different inserted insulators. United States. doi:10.1063/1.4921023.
Liao, M.-H., E-mail: mhliaoa@ntu.edu.tw, and Lien, C. Fri . "The comprehensive study and the reduction of contact resistivity on the n-InGaAs M-I-S contact system with different inserted insulators". United States. doi:10.1063/1.4921023.
@article{osti_22488576,
title = {The comprehensive study and the reduction of contact resistivity on the n-InGaAs M-I-S contact system with different inserted insulators},
author = {Liao, M.-H., E-mail: mhliaoa@ntu.edu.tw and Lien, C.},
abstractNote = {Five different kinds of insulators including BaTiO{sub 3}, TiO{sub 2}, Al{sub 2}O{sub 3}, CdO and ZnO on the n-type InGaAs metal-insulator-semiconductor (M-I-S) ohmic contact structure are studied. The effect for the dielectric constant (ε) of inserted insulator and the conduction band offset (CBO) between an insulator and semiconductor substrate is analyzed by a unified M-I-S contact model. Based on the theoretical model and experimental data, we demonstrates that the inserted ZnO insulator with the high electron affinity and the low CBO (∼0.1 eV) to the InGaAs substrate results in ∼10 times contact resistivity reduction, even the ε of ZnO is not pretty high (∼10)},
doi = {10.1063/1.4921023},
journal = {AIP Advances},
issn = {2158-3226},
number = 5,
volume = 5,
place = {United States},
year = {2015},
month = {5}
}