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Title: Disordered crystal structure of 20H-AlON, Al{sub 10}O{sub 3}N{sub 8}

Abstract

The disordered crystal structure of 20H-AlON (Al{sub 10}O{sub 3}N{sub 8}) was determined by combined use of X-ray powder diffraction and transmission electron microscopy. The title compound is hexagonal with space group P6{sub 3}/mmc (Z=2) and the unit-cell dimensions are a=0.307082(5) nm, c=5.29447(8) nm and V=0.432376(12) nm{sup 3}. The structural model showed the positional disordering of three of the six Al sites in the unit cell. The reliability indices calculated from the Rietveld method were R{sub wp}=6.97%, S (=R{sub wp}/R{sub e})=1.68, R{sub p}=5.45%, R{sub B}=5.13% and R{sub F}=4.56%. We interpreted the disordered structure of 20H-AlON as a statistical average of six different types of ordered structural configurations, which are composed of an octahedral [Al(O, N){sub 6}] layer and tetrahedral [Al(O, N){sub 4}] layers. We demonstrated the high correlations between the hexagonal unit-cell dimensions and the octahedral layer concentrations for AlON and SiAlON polytypoids. - Graphical abstract: Variations of a and c/(n{sub O}+n{sub T}) with n{sub O}/(n{sub O}+n{sub T}). The a and c are the hexagonal unit-cell dimensions of AlON, SiAlON and AlN. The n{sub O} and n{sub T} are, respectively, the numbers of octahedral and tetrahedral layers in the unit cells. The unit-cell dimensions in literature are plotted in black plusmore » for AlON and black cross for SiAlON. The unit-cell dimensions of AlN are a=0.3110 nm and c=0.4980 nm. - Highlights: • Crystal structure of Al10O3N8 is determined by laboratory X-ray powder diffraction. • The atom arrangements are represented by the split-atom model. • Six types of ordered atom arrangements are derived from the disordered structure. • Hexagonal unit-cell dimensions changed systematically for AlON and SiAlON compounds.« less

Authors:
 [1];  [2];  [3];  [1];  [3];  [1]
  1. Department of Materials Science and Engineering, Nagoya Institute of Technology, Nagoya 466-8555 (Japan)
  2. (Japan)
  3. Sialon Unit, National Institute for Materials Science, Tsukuba 305-0044 (Japan)
Publication Date:
OSTI Identifier:
22486800
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Solid State Chemistry; Journal Volume: 230; Other Information: Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ALUMINIUM NITRIDES; ALUMINIUM OXIDES; CERAMICS; CONCENTRATION RATIO; CORRELATIONS; HCP LATTICES; LATTICE PARAMETERS; LAYERS; SILICON NITRIDES; STRUCTURAL MODELS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION

Citation Formats

Banno, Hiroki, Research Fellow of Japan Society for the Promotion of Science, Funahashi, Shiro, Asaka, Toru, Hirosaki, Naoto, and Fukuda, Koichiro, E-mail: fukuda.koichiro@nitech.ac.jp. Disordered crystal structure of 20H-AlON, Al{sub 10}O{sub 3}N{sub 8}. United States: N. p., 2015. Web. doi:10.1016/J.JSSC.2015.06.043.
Banno, Hiroki, Research Fellow of Japan Society for the Promotion of Science, Funahashi, Shiro, Asaka, Toru, Hirosaki, Naoto, & Fukuda, Koichiro, E-mail: fukuda.koichiro@nitech.ac.jp. Disordered crystal structure of 20H-AlON, Al{sub 10}O{sub 3}N{sub 8}. United States. doi:10.1016/J.JSSC.2015.06.043.
Banno, Hiroki, Research Fellow of Japan Society for the Promotion of Science, Funahashi, Shiro, Asaka, Toru, Hirosaki, Naoto, and Fukuda, Koichiro, E-mail: fukuda.koichiro@nitech.ac.jp. Thu . "Disordered crystal structure of 20H-AlON, Al{sub 10}O{sub 3}N{sub 8}". United States. doi:10.1016/J.JSSC.2015.06.043.
@article{osti_22486800,
title = {Disordered crystal structure of 20H-AlON, Al{sub 10}O{sub 3}N{sub 8}},
author = {Banno, Hiroki and Research Fellow of Japan Society for the Promotion of Science and Funahashi, Shiro and Asaka, Toru and Hirosaki, Naoto and Fukuda, Koichiro, E-mail: fukuda.koichiro@nitech.ac.jp},
abstractNote = {The disordered crystal structure of 20H-AlON (Al{sub 10}O{sub 3}N{sub 8}) was determined by combined use of X-ray powder diffraction and transmission electron microscopy. The title compound is hexagonal with space group P6{sub 3}/mmc (Z=2) and the unit-cell dimensions are a=0.307082(5) nm, c=5.29447(8) nm and V=0.432376(12) nm{sup 3}. The structural model showed the positional disordering of three of the six Al sites in the unit cell. The reliability indices calculated from the Rietveld method were R{sub wp}=6.97%, S (=R{sub wp}/R{sub e})=1.68, R{sub p}=5.45%, R{sub B}=5.13% and R{sub F}=4.56%. We interpreted the disordered structure of 20H-AlON as a statistical average of six different types of ordered structural configurations, which are composed of an octahedral [Al(O, N){sub 6}] layer and tetrahedral [Al(O, N){sub 4}] layers. We demonstrated the high correlations between the hexagonal unit-cell dimensions and the octahedral layer concentrations for AlON and SiAlON polytypoids. - Graphical abstract: Variations of a and c/(n{sub O}+n{sub T}) with n{sub O}/(n{sub O}+n{sub T}). The a and c are the hexagonal unit-cell dimensions of AlON, SiAlON and AlN. The n{sub O} and n{sub T} are, respectively, the numbers of octahedral and tetrahedral layers in the unit cells. The unit-cell dimensions in literature are plotted in black plus for AlON and black cross for SiAlON. The unit-cell dimensions of AlN are a=0.3110 nm and c=0.4980 nm. - Highlights: • Crystal structure of Al10O3N8 is determined by laboratory X-ray powder diffraction. • The atom arrangements are represented by the split-atom model. • Six types of ordered atom arrangements are derived from the disordered structure. • Hexagonal unit-cell dimensions changed systematically for AlON and SiAlON compounds.},
doi = {10.1016/J.JSSC.2015.06.043},
journal = {Journal of Solid State Chemistry},
number = ,
volume = 230,
place = {United States},
year = {Thu Oct 15 00:00:00 EDT 2015},
month = {Thu Oct 15 00:00:00 EDT 2015}
}