Versatile atomic force microscopy setup combined with micro-focused X-ray beam

Journal Article · Mon Jun 15 00:00:00 EDT 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4922605· OSTI ID:22483249

Tholapi, R.; Liefeith, L.; Hansen, W. ^[1]; Fester, M.; Sprung, M. ^[2]

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1. Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Jungiusstraße 11, D-20355 Hamburg (Germany)
2. DESY Photon Science, Notkestraße 85, 22607 Hamburg (Germany)

Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure, and performance of the setup are presented.

• OSTI ID: 22483249
• Journal Information: Review of Scientific Instruments, Vol. 86, Issue 6; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALIGNMENT
ATOMIC FORCE MICROSCOPY
BEAMS
DESIGN
HARD X RADIATION
ILLUMINANCE
NANOSTRUCTURES
PERFORMANCE
POSITIONING
STRAINS
SYNCHROTRON RADIATION SOURCES
SYNCHROTRONS