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Title: Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications

Abstract

A method which allows scanning tunneling microscopy (STM) tip biasing independent of the sample bias during frequency modulated atomic force microscopy (AFM) operation is presented. The AFM sensor is supplied by an electronic circuit combining both a frequency shift signal and a tunneling current signal by means of an inductive coupling. This solution enables a control of the tip potential independent of the sample potential. Individual tip biasing is specifically important in order to implement multi-tip STM/AFM applications. An extensional quartz sensor (needle sensor) with a conductive tip is applied to record simultaneously topography and conductivity of the sample. The high resonance frequency of the needle sensor (1 MHz) allows scanning of a large area of the surface being investigated in a reasonably short time. A recipe for the amplitude calibration which is based only on the frequency shift signal and does not require the tip being in contact is presented. Additionally, we show spectral measurements of the mechanical vibration noise of the scanning system used in the investigations.

Authors:
 [1]; ; ;  [1]
  1. Peter Grünberg Institut (PGI-3) and JARA-Fundamentals of Future Information Technology, Forschungszentrum Jülich, 52425 Jülich (Germany)
Publication Date:
OSTI Identifier:
22482651
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 12; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ATOMIC FORCE MICROSCOPY; DETECTION; ELECTRONIC CIRCUITS; MHZ RANGE 01-100; QUARTZ; SCANNING TUNNELING MICROSCOPY; SENSORS; SIGNALS

Citation Formats

Morawski, Ireneusz, Institute of Experimental Physics, University of Wrocław, pl. M. Borna 9, 50-204 Wrocław, Spiegelberg, Richard, Korte, Stefan, and Voigtländer, Bert. Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications. United States: N. p., 2015. Web. doi:10.1063/1.4936975.
Morawski, Ireneusz, Institute of Experimental Physics, University of Wrocław, pl. M. Borna 9, 50-204 Wrocław, Spiegelberg, Richard, Korte, Stefan, & Voigtländer, Bert. Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications. United States. https://doi.org/10.1063/1.4936975
Morawski, Ireneusz, Institute of Experimental Physics, University of Wrocław, pl. M. Borna 9, 50-204 Wrocław, Spiegelberg, Richard, Korte, Stefan, and Voigtländer, Bert. Tue . "Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications". United States. https://doi.org/10.1063/1.4936975.
@article{osti_22482651,
title = {Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications},
author = {Morawski, Ireneusz and Institute of Experimental Physics, University of Wrocław, pl. M. Borna 9, 50-204 Wrocław and Spiegelberg, Richard and Korte, Stefan and Voigtländer, Bert},
abstractNote = {A method which allows scanning tunneling microscopy (STM) tip biasing independent of the sample bias during frequency modulated atomic force microscopy (AFM) operation is presented. The AFM sensor is supplied by an electronic circuit combining both a frequency shift signal and a tunneling current signal by means of an inductive coupling. This solution enables a control of the tip potential independent of the sample potential. Individual tip biasing is specifically important in order to implement multi-tip STM/AFM applications. An extensional quartz sensor (needle sensor) with a conductive tip is applied to record simultaneously topography and conductivity of the sample. The high resonance frequency of the needle sensor (1 MHz) allows scanning of a large area of the surface being investigated in a reasonably short time. A recipe for the amplitude calibration which is based only on the frequency shift signal and does not require the tip being in contact is presented. Additionally, we show spectral measurements of the mechanical vibration noise of the scanning system used in the investigations.},
doi = {10.1063/1.4936975},
url = {https://www.osti.gov/biblio/22482651}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 12,
volume = 86,
place = {United States},
year = {2015},
month = {12}
}