skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Multicolor and near-infrared electroluminescence from the light-emitting devices with rare-earth doped TiO{sub 2} films

Abstract

We report on multicolor and near-infrared electroluminescence (EL) from the devices using rare-earth doped TiO{sub 2} (TiO{sub 2}:RE) films as light-emitting layers, which are ascribed to the impact excitation of RE{sup 3+} ions, with the EL onset voltages below 10 V. The devices are in the structure of ITO/TiO{sub 2}:RE/SiO{sub 2}/Si, in which the SiO{sub 2} layer is ∼10 nm thick and RE includes Eu, Er, Tm, Nd, and so on. With sufficiently high positive voltage applied on the ITO electrode, the conduction electrons in Si can tunnel into the conduction band of SiO{sub 2} layer via the trap-assisted tunneling mechanism, gaining the potential energy ∼4 eV higher than the conduction band edge of TiO{sub 2}. Therefore, as the electrons in the SiO{sub 2} layer drift into the TiO{sub 2}:RE layer, they become hot electrons. Such hot electrons impact-excite the RE{sup 3+} ions incorporated into the TiO{sub 2} host, leading to the characteristic emissions.

Authors:
; ; ; ; ;  [1];  [1];  [2]
  1. State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027 (China)
  2. (China)
Publication Date:
OSTI Identifier:
22482155
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 107; Journal Issue: 13; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; DOPED MATERIALS; ELECTRIC POTENTIAL; ELECTROLUMINESCENCE; FILMS; LAYERS; RARE EARTHS; RHENIUM IONS; SILICON OXIDES; TITANIUM OXIDES; TUNNEL EFFECT; VISIBLE RADIATION

Citation Formats

Zhu, Chen, Gao, Zhifei, Wang, Canxing, Li, Dongsheng, Ma, Xiangyang, E-mail: mxyoung@zju.edu.cn, Yang, Deren, Lv, Chunyan, and Department of Chemistry, Huzhou University, Huzhou 313000, Zhejiang. Multicolor and near-infrared electroluminescence from the light-emitting devices with rare-earth doped TiO{sub 2} films. United States: N. p., 2015. Web. doi:10.1063/1.4932064.
Zhu, Chen, Gao, Zhifei, Wang, Canxing, Li, Dongsheng, Ma, Xiangyang, E-mail: mxyoung@zju.edu.cn, Yang, Deren, Lv, Chunyan, & Department of Chemistry, Huzhou University, Huzhou 313000, Zhejiang. Multicolor and near-infrared electroluminescence from the light-emitting devices with rare-earth doped TiO{sub 2} films. United States. doi:10.1063/1.4932064.
Zhu, Chen, Gao, Zhifei, Wang, Canxing, Li, Dongsheng, Ma, Xiangyang, E-mail: mxyoung@zju.edu.cn, Yang, Deren, Lv, Chunyan, and Department of Chemistry, Huzhou University, Huzhou 313000, Zhejiang. Mon . "Multicolor and near-infrared electroluminescence from the light-emitting devices with rare-earth doped TiO{sub 2} films". United States. doi:10.1063/1.4932064.
@article{osti_22482155,
title = {Multicolor and near-infrared electroluminescence from the light-emitting devices with rare-earth doped TiO{sub 2} films},
author = {Zhu, Chen and Gao, Zhifei and Wang, Canxing and Li, Dongsheng and Ma, Xiangyang, E-mail: mxyoung@zju.edu.cn and Yang, Deren and Lv, Chunyan and Department of Chemistry, Huzhou University, Huzhou 313000, Zhejiang},
abstractNote = {We report on multicolor and near-infrared electroluminescence (EL) from the devices using rare-earth doped TiO{sub 2} (TiO{sub 2}:RE) films as light-emitting layers, which are ascribed to the impact excitation of RE{sup 3+} ions, with the EL onset voltages below 10 V. The devices are in the structure of ITO/TiO{sub 2}:RE/SiO{sub 2}/Si, in which the SiO{sub 2} layer is ∼10 nm thick and RE includes Eu, Er, Tm, Nd, and so on. With sufficiently high positive voltage applied on the ITO electrode, the conduction electrons in Si can tunnel into the conduction band of SiO{sub 2} layer via the trap-assisted tunneling mechanism, gaining the potential energy ∼4 eV higher than the conduction band edge of TiO{sub 2}. Therefore, as the electrons in the SiO{sub 2} layer drift into the TiO{sub 2}:RE layer, they become hot electrons. Such hot electrons impact-excite the RE{sup 3+} ions incorporated into the TiO{sub 2} host, leading to the characteristic emissions.},
doi = {10.1063/1.4932064},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 13,
volume = 107,
place = {United States},
year = {2015},
month = {9}
}