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Title: Synthesis and characterization in AuCu–Si nanostructures

Abstract

Au/Cu bilayers with different Au:Cu concentrations (25:75, 50:50 and 75:25 at.%) were deposited on Si(100) substrates by thermal evaporation. The thicknesses of all Au/Cu bilayers were 150 nm. The alloys were prepared by thermal diffusion into a vacuum oven with argon atmosphere at 690 K during 1 h. X-ray diffraction analysis revealed different phases of AuCu and CuSi alloys in the samples after annealing process. CuSi alloys were mainly obtained for 25:75 at.% samples, meanwhile the AuCuII phase dominates for samples prepared with 50:50 at.%. Additionally, the Au:Cu alloys with 75:25 at.%, produce Au{sub 2}Cu{sub 3} and Au{sub 3}Cu phases. The formed alloys were characterized by scanning electron microscopy (SEM), atomic force microscopy (AFM), transmission electron microscopy (TEM) and energy dispersive spectroscopy (EDS) to study the morphology and the elemental concentration of the formed alloys. - Highlights: • AuCu/Si alloy thin films were prepared by thermal diffusion. • Alloys prepared with 50 at.% of Au produce the AuCuII phase. • Alloys prepared with 75 at.% of Au produce Au{sub 3}Cu and Au{sub 2}Cu{sub 3} phases. • All alloys present diffusion of Si and Cu through the CuSi alloy formation.

Authors:
 [1];  [1];  [2];  [3];  [2]
  1. Centro de Investigación en Materiales Avanzados, S.C., Laboratorio Nacional de Nanotecnología, Av. Miguel de Cervantes 120, Complejo Industrial Chihuahua, 31109 Chihuahua, Chihuahua Mexico (Mexico)
  2. Universidad Anáhuac-Mayab, Carretera Mérida-Progreso Km. 15.5 A.P. 96-Cordemex, CP. 97310 Mérida, Yucatán Mexico (Mexico)
  3. Centro de Investigación y de Estudios Avanzados el IPN Unidad Mérida, Departamento de Física Aplicada, Km 6 Antigua Carretera a Progreso, A.P. 73-Cordemex, 97310 Mérida, Yucatán Mexico (Mexico)
Publication Date:
OSTI Identifier:
22476053
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Characterization; Journal Volume: 101; Other Information: Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; ANNEALING; ATOMIC FORCE MICROSCOPY; BINARY ALLOY SYSTEMS; CONCENTRATION RATIO; COPPER; COPPER COMPOUNDS; GOLD; GOLD COMPOUNDS; LAYERS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SPECTROSCOPY; SUBSTRATES; SYNTHESIS; THERMAL DIFFUSION; THICKNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION

Citation Formats

Novelo, T.E., E-mail: tenovelo@hotmail.com, Amézaga-Madrid, P., Maldonado, R.D., Oliva, A.I., and Alonzo-Medina, G.M. Synthesis and characterization in AuCu–Si nanostructures. United States: N. p., 2015. Web. doi:10.1016/J.MATCHAR.2015.01.010.
Novelo, T.E., E-mail: tenovelo@hotmail.com, Amézaga-Madrid, P., Maldonado, R.D., Oliva, A.I., & Alonzo-Medina, G.M. Synthesis and characterization in AuCu–Si nanostructures. United States. doi:10.1016/J.MATCHAR.2015.01.010.
Novelo, T.E., E-mail: tenovelo@hotmail.com, Amézaga-Madrid, P., Maldonado, R.D., Oliva, A.I., and Alonzo-Medina, G.M. 2015. "Synthesis and characterization in AuCu–Si nanostructures". United States. doi:10.1016/J.MATCHAR.2015.01.010.
@article{osti_22476053,
title = {Synthesis and characterization in AuCu–Si nanostructures},
author = {Novelo, T.E., E-mail: tenovelo@hotmail.com and Amézaga-Madrid, P. and Maldonado, R.D. and Oliva, A.I. and Alonzo-Medina, G.M.},
abstractNote = {Au/Cu bilayers with different Au:Cu concentrations (25:75, 50:50 and 75:25 at.%) were deposited on Si(100) substrates by thermal evaporation. The thicknesses of all Au/Cu bilayers were 150 nm. The alloys were prepared by thermal diffusion into a vacuum oven with argon atmosphere at 690 K during 1 h. X-ray diffraction analysis revealed different phases of AuCu and CuSi alloys in the samples after annealing process. CuSi alloys were mainly obtained for 25:75 at.% samples, meanwhile the AuCuII phase dominates for samples prepared with 50:50 at.%. Additionally, the Au:Cu alloys with 75:25 at.%, produce Au{sub 2}Cu{sub 3} and Au{sub 3}Cu phases. The formed alloys were characterized by scanning electron microscopy (SEM), atomic force microscopy (AFM), transmission electron microscopy (TEM) and energy dispersive spectroscopy (EDS) to study the morphology and the elemental concentration of the formed alloys. - Highlights: • AuCu/Si alloy thin films were prepared by thermal diffusion. • Alloys prepared with 50 at.% of Au produce the AuCuII phase. • Alloys prepared with 75 at.% of Au produce Au{sub 3}Cu and Au{sub 2}Cu{sub 3} phases. • All alloys present diffusion of Si and Cu through the CuSi alloy formation.},
doi = {10.1016/J.MATCHAR.2015.01.010},
journal = {Materials Characterization},
number = ,
volume = 101,
place = {United States},
year = 2015,
month = 3
}
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