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Title: Erbium-doped borosilicate glasses containing various amounts of P{sub 2}O{sub 5} and Al{sub 2}O{sub 3}: Influence of the silica content on the structure and thermal, physical, optical and luminescence properties

Abstract

Highlights: • Er{sup 3+} doped borosilicate glasses were processed with different compositions and characterizations. • An increase in the SiO{sub 2} content leads to a silicate-rich environment around the Er{sup 3+} site. • An increase in the SiO{sub 2} content decreases the Er{sup 3+} absorption cross-section at 980 nm. • Glasses with 60 mol% of SiO{sub 2} exhibit a stronger emission intensity at 1530 nm than glasses with x = 50. • Highest 1.5 μm emission intensity was achieved for the Al and P containing glass with 60 mol% of SiO{sub 2}. - Abstract: The influence of the silica content on several properties of Er-doped borosilicate glasses in the presence of various amounts of P{sub 2}O{sub 5} and Al{sub 2}O{sub 3} has been investigated. The introduction of P{sub 2}O{sub 5} and/or Al{sub 2}O{sub 3} are responsible for structural modifications in the glass network through a charge-compensation mechanism related to the formation of negatively-charged PO{sub 4} and AlO{sub 4} groups or through the formation of AlPO{sub 4}-like structural units. In this paper, we show that an increase in the SiO{sub 2} content leads to a silicate-rich environment around the Er{sup 3+} site, resulting in an increased dependence of the Er{sup 3+}more » ions optical and luminescence properties on the P{sub 2}O{sub 5} and/or Al{sub 2}O{sub 3} concentration. The highest emission intensity at 1.5 μm was achieved for the glass with an equal proportion of P and Al in the glass system with 60 mol% of SiO{sub 2}.« less

Authors:
 [1];  [2];  [3];  [4];  [3];  [5]; ;  [6]; ;  [4]; ;  [7];  [1]
  1. Politecnico di Torino, DISAT, Istituto di Ingegneria e Fisica dei Materiali, Corso Duca degli Abruzzi 24, I-10129 Torino (Italy)
  2. Department of Electronics and Communications Engineering, Tampere University of Technology, Korkeakoulunkatu 3, FI-33720 Tampere (Finland)
  3. (Finland)
  4. Process Chemistry Centre, Åbo Akademi University, Biskopsgatan 8, FI-20500 Turku (Finland)
  5. nLIGHT Corporation, Sorronrinne 9, FI-08500 Lohja (Finland)
  6. CNRS, Université de Bordeaux, ISM, 351 Cours de la Libération, F-33405 Talence (France)
  7. CNRS, Université de Bordeaux, ICMCB, 87 Avenue du Dr Schweitzer, F-33608 Pessac (France)
Publication Date:
OSTI Identifier:
22475888
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 70; Other Information: Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABSORPTION SPECTROSCOPY; ALUMINIUM OXIDES; ALUMINIUM PHOSPHATES; BOROSILICATE GLASS; CROSS SECTIONS; DOPED MATERIALS; ERBIUM ADDITIONS; INFRARED SPECTRA; LUMINESCENCE; MODIFICATIONS; OPTICAL PROPERTIES; PHOSPHORUS OXIDES; PHOTOELECTRON SPECTROSCOPY; SILICATES; SILICON OXIDES

Citation Formats

Bourhis, Kevin, Massera, Jonathan, BioMediTech, Tampere, Petit, Laeticia, E-mail: laeticia.petit@nlight.net, nLIGHT Corporation, Sorronrinne 9, FI-08500 Lohja, Koponen, Joona, Fargues, Alexandre, Cardinal, Thierry, Hupa, Leena, Hupa, Mikko, Dussauze, Marc, Rodriguez, Vincent, and Ferraris, Monica. Erbium-doped borosilicate glasses containing various amounts of P{sub 2}O{sub 5} and Al{sub 2}O{sub 3}: Influence of the silica content on the structure and thermal, physical, optical and luminescence properties. United States: N. p., 2015. Web. doi:10.1016/J.MATERRESBULL.2015.04.017.
Bourhis, Kevin, Massera, Jonathan, BioMediTech, Tampere, Petit, Laeticia, E-mail: laeticia.petit@nlight.net, nLIGHT Corporation, Sorronrinne 9, FI-08500 Lohja, Koponen, Joona, Fargues, Alexandre, Cardinal, Thierry, Hupa, Leena, Hupa, Mikko, Dussauze, Marc, Rodriguez, Vincent, & Ferraris, Monica. Erbium-doped borosilicate glasses containing various amounts of P{sub 2}O{sub 5} and Al{sub 2}O{sub 3}: Influence of the silica content on the structure and thermal, physical, optical and luminescence properties. United States. doi:10.1016/J.MATERRESBULL.2015.04.017.
Bourhis, Kevin, Massera, Jonathan, BioMediTech, Tampere, Petit, Laeticia, E-mail: laeticia.petit@nlight.net, nLIGHT Corporation, Sorronrinne 9, FI-08500 Lohja, Koponen, Joona, Fargues, Alexandre, Cardinal, Thierry, Hupa, Leena, Hupa, Mikko, Dussauze, Marc, Rodriguez, Vincent, and Ferraris, Monica. 2015. "Erbium-doped borosilicate glasses containing various amounts of P{sub 2}O{sub 5} and Al{sub 2}O{sub 3}: Influence of the silica content on the structure and thermal, physical, optical and luminescence properties". United States. doi:10.1016/J.MATERRESBULL.2015.04.017.
@article{osti_22475888,
title = {Erbium-doped borosilicate glasses containing various amounts of P{sub 2}O{sub 5} and Al{sub 2}O{sub 3}: Influence of the silica content on the structure and thermal, physical, optical and luminescence properties},
author = {Bourhis, Kevin and Massera, Jonathan and BioMediTech, Tampere and Petit, Laeticia, E-mail: laeticia.petit@nlight.net and nLIGHT Corporation, Sorronrinne 9, FI-08500 Lohja and Koponen, Joona and Fargues, Alexandre and Cardinal, Thierry and Hupa, Leena and Hupa, Mikko and Dussauze, Marc and Rodriguez, Vincent and Ferraris, Monica},
abstractNote = {Highlights: • Er{sup 3+} doped borosilicate glasses were processed with different compositions and characterizations. • An increase in the SiO{sub 2} content leads to a silicate-rich environment around the Er{sup 3+} site. • An increase in the SiO{sub 2} content decreases the Er{sup 3+} absorption cross-section at 980 nm. • Glasses with 60 mol% of SiO{sub 2} exhibit a stronger emission intensity at 1530 nm than glasses with x = 50. • Highest 1.5 μm emission intensity was achieved for the Al and P containing glass with 60 mol% of SiO{sub 2}. - Abstract: The influence of the silica content on several properties of Er-doped borosilicate glasses in the presence of various amounts of P{sub 2}O{sub 5} and Al{sub 2}O{sub 3} has been investigated. The introduction of P{sub 2}O{sub 5} and/or Al{sub 2}O{sub 3} are responsible for structural modifications in the glass network through a charge-compensation mechanism related to the formation of negatively-charged PO{sub 4} and AlO{sub 4} groups or through the formation of AlPO{sub 4}-like structural units. In this paper, we show that an increase in the SiO{sub 2} content leads to a silicate-rich environment around the Er{sup 3+} site, resulting in an increased dependence of the Er{sup 3+} ions optical and luminescence properties on the P{sub 2}O{sub 5} and/or Al{sub 2}O{sub 3} concentration. The highest emission intensity at 1.5 μm was achieved for the glass with an equal proportion of P and Al in the glass system with 60 mol% of SiO{sub 2}.},
doi = {10.1016/J.MATERRESBULL.2015.04.017},
journal = {Materials Research Bulletin},
number = ,
volume = 70,
place = {United States},
year = 2015,
month =
}
  • Highlights: • Reorganization of the glass structure induced by the addition of P{sub 2}O{sub 5} or Al{sub 2}O{sub 3}. • Emission properties related to the presence of P or Al in the Er{sup 3+} coordination shell. • Declustering observed upon addition of P{sub 2}O{sub 5}. • No declustering upon addition of Al{sub 2}O{sub 3}. - Abstract: The effect of P{sub 2}O{sub 5} and/or Al{sub 2}O{sub 3} addition in Er-doped borosilicate glasses on the physical, thermal, optical, and luminescence properties is investigated. The changes in these glass properties are related to the glass structure modifications induced by the addition of P{submore » 2}O{sub 5} and/or Al{sub 2}O{sub 3}, which were probed by FTIR, {sup 11}B MAS NMR and X-ray photoelectron spectroscopies. Variations of the polymerization degree of the silicate tetrahedra and modifications in the {sup [3]}B/{sup [4]}B ratio are explained by a charge compensation mechanism due to the formation of AlO{sub 4}, PO{sub 4} groups and the formation of Al-O-P linkages in the glass network. From the absorption and luminescence properties of the Er{sup 3+} ions at 980 nm and 1530 nm, declustering is suspected for the highest P{sub 2}O{sub 5} concentrations while for the highest Al{sub 2}O{sub 3} concentrations no declustering is observed.« less
  • Iron ion doped lithium borate glasses with the composition 15RO-25Li{sub 2}O-59B{sub 2}O{sub 3}-1Fe{sub 2}O{sub 3} (where R= Ca, Sr and Ba) have been prepared by the conventional melt quenching technique and characterized to investigate the physical and optical properties using XRD, density, molar volume and UV-Visible spectroscopy. The optical absorption spectra exhibit a band at around 460 nm which is assigned to {sup 6}A{sub 1g}(S) → 4E{sub g} (G) of Fe{sup 3+} ions with distorted octahedral symmetry. From ultraviolet absorption edges, the optical band gap and Urbach energies have been evaluated. The effect of alkaline earths on these properties ismore » discussed.« less
  • In this study heavy bismuth-borate glasses were studied as host matrices of Dy 2O 3 rare earth, for potential application as scintillator materials in high energy physics experiments and in general radiation detection systems. Glass matrices were prepared from 20BaO-xBi 2O 3-(80-x)B 2O 3 (x = 20, 30, 40 mol%) ternary systems and synthesized by the melt-quenching method at different temperatures in order to obtain high density and high transparency in the UV/Vis range. Particularly, the glass manifesting the higher transparency and with sufficiently high density was doped with Dy 2O 3 (2.5 and 5 mol%) in order to inducemore » the luminescence characteristics. The effects of Bi 2O 3 and Dy 2O 3 on density, thermal behaviour, transmission as well as luminescence properties under UV excitation, were investigated. The experimental results show that the synthesized glasses can be considered promising candidate materials as dense scintillators, due to the Dy 3 + centres emission.« less
  • New phosphate glasses have been developed in order to incorporate high rare-earth ions concentrations. These glasses present a great chemical stability and a high optical quality. The phosphate glass network is open, very flexible, with a linkage of the tetrahedrons very disordered and contains a larger number of non-bridging oxygens (66%). The great stability and resistance against crystallization associated with the possibility to incorporate high doping concentration of rare-earth ions in these phosphate glasses make them very good candidates for the realization of ultra short single mode amplifiers with a high gain at 1.55 {mu}m.
  • Rutherford backscattering, IR spectroscopy, ellipsometry, and atomic-force microscopy are used to perform an integrated study of the composition, structure and optical properties of a-Si{sub 1-x}C{sub x}:H Left-Pointing-Angle-Bracket Er Right-Pointing-Angle-Bracket amorphous films. The technique employed to obtain the a-Si{sub 1-x}C{sub x}:H Left-Pointing-Angle-Bracket Er Right-Pointing-Angle-Bracket amorphous films includes the high-frequency decomposition of a mixture of gases, (SiH{sub 4}){sub a} + (CH{sub 4}){sub b}, and the simultaneous thermal evaporation of a complex compound, Er(pd){sub 3}. It is demonstrated that raising the amount of CH{sub 4} in the gas mixture results in an increase in the carbon content of the films under study andmore » an increase in the optical gap E{sub g}{sup opt} from 1.75 to 2.2 eV. Changes in the composition of a-Si{sub 1-x}C{sub x}:H Left-Pointing-Angle-Bracket Er Right-Pointing-Angle-Bracket amorphous films, accompanied, in turn, by changes in the optical constants, are observed in the IR spectra. The ellipsometric spectra obtained are analyzed in terms of multiple-parameter models. The conclusion is made on the basis of this analysis that the experimental and calculated spectra coincide well when variation in the composition of the amorphous films with that of the gas mixture is taken into account. The existence of a thin (6-8 nm) silicon-oxide layer on the surface of the films under study and the validity of using the double-layer model in ellipsometric calculations is confirmed by the results of structural analyses by atomic-force microscopy.« less