Effect of Ni content on the structural, morphological and magnetic properties of spray deposited Ni–Zn ferrite thin films

Journal Article · Wed Jul 15 00:00:00 EDT 2015 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2015.02.056· OSTI ID:22475812

Kumbhar, S. S.; Mahadik, M. A.; Mohite, V. S.; Hunge, Y. M.; Rajpure, K. Y.

Graphical abstract: The Ni{sub x}Zn{sub 1−x}Fe{sub 2}O{sub 4} (where x = 0.0, 0.2, 0.4, 0.6, 0.8, 1.0) thin films were prepared by spray pyrolysis technique onto the quartz substrates. The composition x = 0.4 shows the formation of the compact grain structure and highest saturation magnetization of 143 emu/cm{sup 3}. - Highlights: • Synthesis of nanocrystalline Ni{sub x}Zn{sub 1−x}Fe{sub 2}O{sub 4} thin films. • Influence of Ni substitution on physicochemical properties. • Electrical conductivity arises mainly from the grain boundary. • The highest saturation magnetization is 143 emu/cm{sup 3} for x = 0.4. - Abstract: The Ni{sub x}Zn{sub 1−x}Fe{sub 2}O{sub 4} thin films have been prepared using a simple spray pyrolysis technique. The X-ray diffraction studies reveal that, the films are polycrystalline with spinel structure. The lattice parameters vary in the range of 8.35–8.48 Å with composition (x) obeying Vegard’s rule. SEM and AFM studies show that the surface of the films exhibit a smooth, compact and a pin hole free morphology. Raman spectra indicate first order Raman active modes; A{sub 1g} (λ = 334 cm{sup −1}); E{sub g} (λ = 148 cm{sup −1}) and T{sub 2g} (λ = 699) of the Ni{sub x}Zn{sub 1−x}Fe{sub 2}O{sub 4}. The investigation on dielectric constant, dielectric loss tangent and ac conductivity was carried out in the frequency range 20 Hz–1 MHz at room temperature. The linear nature of the AC conductivity shows small polaron type of hopping mechanism. The saturation magnetization increases up to x = 0.4 (143 emu/cm{sup 3}), which decreases for higher x.

• OSTI ID: 22475812
• Journal Information: Materials Research Bulletin, Vol. 67; Other Information: Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ATOMIC FORCE MICROSCOPY
CONCENTRATION RATIO
ELECTRIC CONDUCTIVITY
FERRITES
GRAIN BOUNDARIES
LATTICE PARAMETERS
MAGNETIC PROPERTIES
MAGNETIZATION
NANOSTRUCTURES
NICKEL COMPOUNDS
PERMITTIVITY
RAMAN SPECTRA
RAMAN SPECTROSCOPY
SATURATION
SCANNING ELECTRON MICROSCOPY
SPINELS
SUBSTRATES
THIN FILMS
X-RAY DIFFRACTION
ZINC COMPOUNDS