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Title: Correlation between Pd metal thickness and thermally stable perpendicular magnetic anisotropy features in [Co/Pd]{sub n} multilayers at annealing temperatures up to 500 °C

Abstract

We examine highly stable perpendicular magnetic anisotropy (PMA) features of [Co/Pd]{sub 10} multilayers (MLs) versus Pd thickness at various ex-situ annealing temperatures. Thermally stable PMA characteristics were observed up to 500 °C, confirming the suitability of these systems for industrial applications at this temperature. Experimental observations suggest that the choice of equivalent Co and Pd layer thicknesses in a ML configuration ensures thermally stable PMA features, even at higher annealing temperatures. X-ray diffraction patterns and cross-sectional transmission electron microscopy images were obtained to determine thickness, post-annealing PMA behavior, and to explore the structural features that govern these findings.

Authors:
; ; ;  [1];  [2];  [3];  [1];  [4]
  1. Novel Functional Materials and Devices Lab, The Research Institute for Natural Science, Department of Physics, Hanyang University, Seoul 133-791 (Korea, Republic of)
  2. Division of Nano-Scale Semiconductor Engineering, Hanyang University, Seoul 133-791 (Korea, Republic of)
  3. Nano Quantum Electronics Lab, Department of Electronics and Computer Engineering, Hanyang University, Seoul 133-791 (Korea, Republic of)
  4. (Korea, Republic of)
Publication Date:
OSTI Identifier:
22454462
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 5; Journal Issue: 2; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANISOTROPY; ANNEALING; LAYERS; METALS; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION

Citation Formats

An, Gwang Guk, Lee, Ja Bin, Yang, Seung Mo, Yoon, Kap Soo, Kim, Jae Hong, Chung, Woo Seong, Hong, Jin Pyo, E-mail: jphong@hanyang.ac.kr, and Division of Nano-Scale Semiconductor Engineering, Hanyang University, Seoul 133-791. Correlation between Pd metal thickness and thermally stable perpendicular magnetic anisotropy features in [Co/Pd]{sub n} multilayers at annealing temperatures up to 500 °C. United States: N. p., 2015. Web. doi:10.1063/1.4913997.
An, Gwang Guk, Lee, Ja Bin, Yang, Seung Mo, Yoon, Kap Soo, Kim, Jae Hong, Chung, Woo Seong, Hong, Jin Pyo, E-mail: jphong@hanyang.ac.kr, & Division of Nano-Scale Semiconductor Engineering, Hanyang University, Seoul 133-791. Correlation between Pd metal thickness and thermally stable perpendicular magnetic anisotropy features in [Co/Pd]{sub n} multilayers at annealing temperatures up to 500 °C. United States. doi:10.1063/1.4913997.
An, Gwang Guk, Lee, Ja Bin, Yang, Seung Mo, Yoon, Kap Soo, Kim, Jae Hong, Chung, Woo Seong, Hong, Jin Pyo, E-mail: jphong@hanyang.ac.kr, and Division of Nano-Scale Semiconductor Engineering, Hanyang University, Seoul 133-791. Sun . "Correlation between Pd metal thickness and thermally stable perpendicular magnetic anisotropy features in [Co/Pd]{sub n} multilayers at annealing temperatures up to 500 °C". United States. doi:10.1063/1.4913997.
@article{osti_22454462,
title = {Correlation between Pd metal thickness and thermally stable perpendicular magnetic anisotropy features in [Co/Pd]{sub n} multilayers at annealing temperatures up to 500 °C},
author = {An, Gwang Guk and Lee, Ja Bin and Yang, Seung Mo and Yoon, Kap Soo and Kim, Jae Hong and Chung, Woo Seong and Hong, Jin Pyo, E-mail: jphong@hanyang.ac.kr and Division of Nano-Scale Semiconductor Engineering, Hanyang University, Seoul 133-791},
abstractNote = {We examine highly stable perpendicular magnetic anisotropy (PMA) features of [Co/Pd]{sub 10} multilayers (MLs) versus Pd thickness at various ex-situ annealing temperatures. Thermally stable PMA characteristics were observed up to 500 °C, confirming the suitability of these systems for industrial applications at this temperature. Experimental observations suggest that the choice of equivalent Co and Pd layer thicknesses in a ML configuration ensures thermally stable PMA features, even at higher annealing temperatures. X-ray diffraction patterns and cross-sectional transmission electron microscopy images were obtained to determine thickness, post-annealing PMA behavior, and to explore the structural features that govern these findings.},
doi = {10.1063/1.4913997},
journal = {AIP Advances},
number = 2,
volume = 5,
place = {United States},
year = {Sun Feb 15 00:00:00 EST 2015},
month = {Sun Feb 15 00:00:00 EST 2015}
}