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Title: Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn–Ga films

Abstract

X-ray photoelectron diffraction (XPD) in combination with hard X-ray photoelectron spectroscopy (HAXPES) has been used to study the structure of buried layers in thin multilayer films. A detailed layer-by-layer investigation was performed using the element-specific, local-probe character of XPD. In the present work, angular-resolved HAXPES at a photon energy of 7.94 keV photon energy was used to investigate a Cr/Mn{sub 62}Ga{sub 38}/Mg/MgO multilayer system. Differences in the angular distributions of electrons emitted from Mn and Ga atoms revealed that the structure of Mn{sub 62}Ga{sub 38} changes from L1{sub 0} towards D0{sub 22} for increasing annealing temperatures. A c/a ratio of 1.81 ± 0.06 was determined for the buried Mn{sub 62}Ga{sub 38} layer in a D0{sub 22} structure from the XPD experiment. The improvement of the structural order of the Mn{sub 62}Ga{sub 38} layer is accompanied by an improvement of the structure of the overlying MgO layer.

Authors:
; ; ;  [1]; ; ;  [2];  [3]
  1. Max-Planck-Institut für Chemische Physik fester Stoffe, 01187 Dresden (Germany)
  2. WPI Advanced Institute for Materials Research Tohoku University, Sendai 980-8577 (Japan)
  3. Japan Synchrotron Radiation Research Institute, SPring-8, Sayo, Hyogo 679-5198 (Japan)
Publication Date:
OSTI Identifier:
22420254
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 5; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CHROMIUM; GALLIUM; HARD X RADIATION; LAYERS; MAGNESIUM; MAGNESIUM OXIDES; MANGANESE; PHOTONS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY

Citation Formats

ViolBarbosa, Carlos E., E-mail: carlos.barbosa@cpfs.mpg.de, Ouardi, Siham, Fecher, Gerhard H., E-mail: fecher@cpfs.mpg.de, Felser, Claudia, Kubota, Takahide, Mizukami, Shigemi, Miyazaki, Terunobu, and Ikenaga, Eiji. Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn–Ga films. United States: N. p., 2015. Web. doi:10.1063/1.4907537.
ViolBarbosa, Carlos E., E-mail: carlos.barbosa@cpfs.mpg.de, Ouardi, Siham, Fecher, Gerhard H., E-mail: fecher@cpfs.mpg.de, Felser, Claudia, Kubota, Takahide, Mizukami, Shigemi, Miyazaki, Terunobu, & Ikenaga, Eiji. Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn–Ga films. United States. doi:10.1063/1.4907537.
ViolBarbosa, Carlos E., E-mail: carlos.barbosa@cpfs.mpg.de, Ouardi, Siham, Fecher, Gerhard H., E-mail: fecher@cpfs.mpg.de, Felser, Claudia, Kubota, Takahide, Mizukami, Shigemi, Miyazaki, Terunobu, and Ikenaga, Eiji. Mon . "Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn–Ga films". United States. doi:10.1063/1.4907537.
@article{osti_22420254,
title = {Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn–Ga films},
author = {ViolBarbosa, Carlos E., E-mail: carlos.barbosa@cpfs.mpg.de and Ouardi, Siham and Fecher, Gerhard H., E-mail: fecher@cpfs.mpg.de and Felser, Claudia and Kubota, Takahide and Mizukami, Shigemi and Miyazaki, Terunobu and Ikenaga, Eiji},
abstractNote = {X-ray photoelectron diffraction (XPD) in combination with hard X-ray photoelectron spectroscopy (HAXPES) has been used to study the structure of buried layers in thin multilayer films. A detailed layer-by-layer investigation was performed using the element-specific, local-probe character of XPD. In the present work, angular-resolved HAXPES at a photon energy of 7.94 keV photon energy was used to investigate a Cr/Mn{sub 62}Ga{sub 38}/Mg/MgO multilayer system. Differences in the angular distributions of electrons emitted from Mn and Ga atoms revealed that the structure of Mn{sub 62}Ga{sub 38} changes from L1{sub 0} towards D0{sub 22} for increasing annealing temperatures. A c/a ratio of 1.81 ± 0.06 was determined for the buried Mn{sub 62}Ga{sub 38} layer in a D0{sub 22} structure from the XPD experiment. The improvement of the structural order of the Mn{sub 62}Ga{sub 38} layer is accompanied by an improvement of the structure of the overlying MgO layer.},
doi = {10.1063/1.4907537},
journal = {Applied Physics Letters},
number = 5,
volume = 106,
place = {United States},
year = {Mon Feb 02 00:00:00 EST 2015},
month = {Mon Feb 02 00:00:00 EST 2015}
}