A study of vacancy defects related to gray tracks in KTiOPO{sub 4} (KTP) using positron annihilation

Journal Article · Mon Dec 15 00:00:00 EST 2014 · AIP Advances

DOI:https://doi.org/10.1063/1.4903305· OSTI ID:22420191

Zhang, Yang; Li, Jing; Wang, Jiyang; Jiang, Huaidong ^[1]; Cao, Xingzhong; Yang, Jing ^[2]

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1. State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100 (China)
2. Key Laboratory of Nuclear Analysis Techniques, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China)

For the first time to our knowledge, positron annihilation spectroscopy (PAS) was used to study vacancy defects in KTiOPO{sub 4} (KTP) single crystals. Positron annihilation lifetime spectroscopy combined with dielectric measurements identified the existence of oxygen vacancies and reflected the concentration of vacancy defects in three samples. The vacancy defects in KTP do not consist of monovacancies, but rather vacancy complexes. Doppler broadening indicates that the vacancy defects are distributed uniformly. A relationship is established where a crystal with a low oxygen vacancy concentration and a highly balanced stoichiometry has a higher resistance to gray track formation.

• OSTI ID: 22420191
• Journal Information: AIP Advances, Vol. 4, Issue 12; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ANNIHILATION
DEFECTS
DIELECTRIC MATERIALS
DOPPLER BROADENING
MONOCRYSTALS
OXYGEN
PARTICLE TRACKS
RADIATION DOSE UNITS
SPECTROSCOPY
VACANCIES