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Title: Beam tracking approach for single–shot retrieval of absorption, refraction, and dark-field signals with laboratory  x-ray sources

Abstract

We present the translation of the beam tracking approach for x-ray phase-contrast and dark-field imaging, recently demonstrated using synchrotron radiation, to a laboratory setup. A single absorbing mask is used before the sample, and a local Gaussian interpolation of the beam at the detector is used to extract absorption, refraction, and dark–field signals from a single exposure of the sample. Multiple exposures can be acquired when high resolution is needed, as shown here. A theoretical analysis of the effect of polychromaticity on the retrieved signals, and of the artifacts this might cause when existing retrieval methods are used, is also discussed.

Authors:
; ;  [1];  [2]; ; ;  [1];  [3];  [2]
  1. Department of Medical Physics and Biomedical Engineering, University College London, Malet Place, Gower Street, London WC1E 6BT (United Kingdom)
  2. (United Kingdom)
  3. Research Complex at Harwell, Harwell Oxford Campus, OX11 0FA Didcot (United Kingdom)
Publication Date:
OSTI Identifier:
22413628
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 22; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; BIOMEDICAL RADIOGRAPHY; INTERPOLATION; PHOTON BEAMS; REFRACTION; SYNCHROTRON RADIATION; X RADIATION; X-RAY SOURCES

Citation Formats

Vittoria, Fabio A., E-mail: fabio.vittoria.12@ucl.ac.uk, Diemoz, Paul C., Olivo, Alessandro, Research Complex at Harwell, Harwell Oxford Campus, OX11 0FA Didcot, Kallon, Gibril K. N., Basta, Dario, Endrizzi, Marco, Robinson, Ian K., and London Centre for Nanotechnology, WC1H 0AH London. Beam tracking approach for single–shot retrieval of absorption, refraction, and dark-field signals with laboratory  x-ray sources. United States: N. p., 2015. Web. doi:10.1063/1.4922189.
Vittoria, Fabio A., E-mail: fabio.vittoria.12@ucl.ac.uk, Diemoz, Paul C., Olivo, Alessandro, Research Complex at Harwell, Harwell Oxford Campus, OX11 0FA Didcot, Kallon, Gibril K. N., Basta, Dario, Endrizzi, Marco, Robinson, Ian K., & London Centre for Nanotechnology, WC1H 0AH London. Beam tracking approach for single–shot retrieval of absorption, refraction, and dark-field signals with laboratory  x-ray sources. United States. doi:10.1063/1.4922189.
Vittoria, Fabio A., E-mail: fabio.vittoria.12@ucl.ac.uk, Diemoz, Paul C., Olivo, Alessandro, Research Complex at Harwell, Harwell Oxford Campus, OX11 0FA Didcot, Kallon, Gibril K. N., Basta, Dario, Endrizzi, Marco, Robinson, Ian K., and London Centre for Nanotechnology, WC1H 0AH London. 2015. "Beam tracking approach for single–shot retrieval of absorption, refraction, and dark-field signals with laboratory  x-ray sources". United States. doi:10.1063/1.4922189.
@article{osti_22413628,
title = {Beam tracking approach for single–shot retrieval of absorption, refraction, and dark-field signals with laboratory  x-ray sources},
author = {Vittoria, Fabio A., E-mail: fabio.vittoria.12@ucl.ac.uk and Diemoz, Paul C. and Olivo, Alessandro and Research Complex at Harwell, Harwell Oxford Campus, OX11 0FA Didcot and Kallon, Gibril K. N. and Basta, Dario and Endrizzi, Marco and Robinson, Ian K. and London Centre for Nanotechnology, WC1H 0AH London},
abstractNote = {We present the translation of the beam tracking approach for x-ray phase-contrast and dark-field imaging, recently demonstrated using synchrotron radiation, to a laboratory setup. A single absorbing mask is used before the sample, and a local Gaussian interpolation of the beam at the detector is used to extract absorption, refraction, and dark–field signals from a single exposure of the sample. Multiple exposures can be acquired when high resolution is needed, as shown here. A theoretical analysis of the effect of polychromaticity on the retrieved signals, and of the artifacts this might cause when existing retrieval methods are used, is also discussed.},
doi = {10.1063/1.4922189},
journal = {Applied Physics Letters},
number = 22,
volume = 106,
place = {United States},
year = 2015,
month = 6
}
  • We propose two different approaches to retrieve x-ray absorption, refraction, and scattering signals using a one dimensional scan and a high resolution detector. The first method can be easily implemented in existing procedures developed for edge illumination to retrieve absorption and refraction signals, giving comparable image quality while reducing exposure time and delivered dose. The second method tracks the variations of the beam intensity profile on the detector through a multi-Gaussian interpolation, allowing the additional retrieval of the scattering signal.
  • With the help of adapted off-axis reflection zone plates, near edge X-ray absorption fine structure spectra at the C and N K-absorption edge have been recorded using a single 1.2 ns long soft X-ray pulse. The transmission experiments were performed with a laser-produced plasma source in the laboratory rendering time resolved measurements feasible independent on large scale facilities. A resolving power of E/ΔE ∼ 950 at the respective edges could be demonstrated. A comparison of single shot spectra with those collected with longer measuring time proves that all features of the used reference samples (silicon nitrate and polyimide) can be resolved in 1.2 ns.more » Hence, investigations of radiation sensitive biological specimen become possible due to the high efficiency of the optical elements enabling low dose experiments.« less
  • The Talbot–Lau x-ray moiré deflectometer is a powerful plasma diagnostic capable of delivering simultaneous refraction and attenuation information through the accurate detection of x-ray phase shift and intensity. The diagnostic can provide the index of refraction n=1₋δ + iβ of an object (dense plasma, for example) placed in the x-ray beam by independently measuring both δ and β, which are directly related to the electron density n e and the attenuation coefficient μ respectively. Since δ and β depend on the effective atomic number Z eff, a map can be obtained from the ratio between phase and absorption images acquiredmore » in a single shot. The Talbot–Lau x-ray moiré deflectometer and its corresponding data acquisition and processing are briefly described to illustrate how the above is achieved; Z eff values of test objects within the 4₋12 range were obtained experimentally through simultaneous refraction and attenuation measurements. We show that Z eff mapping of objects does not require previous knowledge of sample length or shape. In conclusion, the determination of Z eff from refraction and attenuation measurements with moiré deflectometry could be of high interest to various domains of high energy density research, such as shocked materials and inertial confinement fusion experiments, as well as material science and nondestructive testing.« less
  • The Talbot–Lau x-ray moiré deflectometer is a powerful plasma diagnostic capable of delivering simultaneous refraction and attenuation information through the accurate detection of x-ray phase shift and intensity. The diagnostic can provide the index of refraction n=1₋δ + iβ of an object (dense plasma, for example) placed in the x-ray beam by independently measuring both δ and β, which are directly related to the electron density n e and the attenuation coefficient μ respectively. Since δ and β depend on the effective atomic number Z eff, a map can be obtained from the ratio between phase and absorption images acquiredmore » in a single shot. The Talbot–Lau x-ray moiré deflectometer and its corresponding data acquisition and processing are briefly described to illustrate how the above is achieved; Z eff values of test objects within the 4₋12 range were obtained experimentally through simultaneous refraction and attenuation measurements. We show that Z eff mapping of objects does not require previous knowledge of sample length or shape. In conclusion, the determination of Z eff from refraction and attenuation measurements with moiré deflectometry could be of high interest to various domains of high energy density research, such as shocked materials and inertial confinement fusion experiments, as well as material science and nondestructive testing.« less