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Title: Structural phase transition of ternary dielectric SmGdO{sub 3}: Evidence from angle dispersive x-ray diffraction and Raman spectroscopic studies

Abstract

High-pressure synchrotron based angle dispersive x-ray diffraction (ADXRD) studies were carried out on SmGdO{sub 3} (SGO) up to 25.7 GPa at room temperature. ADXRD results indicated a reversible pressure-induced phase transition from ambient monoclinic to hexagonal phase at ∼8.9 GPa. The observed pressure-volume data were fitted with the third order Birch-Murnaghan equation of state yielding zero pressure bulk modulus B{sub 0} = 132(22) and 177(9) GPa for monoclinic (B-type) and hexagonal (A-type) phases, respectively. Pressure dependent micro-Raman spectroscopy further confirmed the monoclinic to hexagonal phase transition at about 5.24 GPa. The mode Grüneisen parameters and pressure coefficients for different Raman modes corresponding to each individual phases of SGO were calculated using pressure dependent Raman mode analysis.

Authors:
; ; ; ;  [1]; ; ;  [2]
  1. Department of Physics and Institute for Functional Nanomaterials, University of Puerto Rico, San Juan, Puerto Rico 00936-8377 (United States)
  2. High Pressure and Synchrotron Radiation Physics Division, Bhabha Atomic Research Centre, Mumbai (India)
Publication Date:
OSTI Identifier:
22413209
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 9; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DIELECTRIC MATERIALS; EQUATIONS OF STATE; GADOLINIUM OXIDES; HEXAGONAL LATTICES; MONOCLINIC LATTICES; PHASE TRANSFORMATIONS; PRESSURE COEFFICIENT; PRESSURE DEPENDENCE; RAMAN SPECTROSCOPY; SAMARIUM COMPOUNDS; TEMPERATURE RANGE 0273-0400 K; ULTIMATE STRENGTH; X-RAY DIFFRACTION

Citation Formats

Sharma, Yogesh, E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu, Sahoo, Satyaprakash, E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu, Misra, Pankaj, Pavunny, Shojan P., Katiyar, Ram S., E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu, Mishra, A. K., Dwivedi, Abhilash, and Sharma, S. M.. Structural phase transition of ternary dielectric SmGdO{sub 3}: Evidence from angle dispersive x-ray diffraction and Raman spectroscopic studies. United States: N. p., 2015. Web. doi:10.1063/1.4913776.
Sharma, Yogesh, E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu, Sahoo, Satyaprakash, E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu, Misra, Pankaj, Pavunny, Shojan P., Katiyar, Ram S., E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu, Mishra, A. K., Dwivedi, Abhilash, & Sharma, S. M.. Structural phase transition of ternary dielectric SmGdO{sub 3}: Evidence from angle dispersive x-ray diffraction and Raman spectroscopic studies. United States. doi:10.1063/1.4913776.
Sharma, Yogesh, E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu, Sahoo, Satyaprakash, E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu, Misra, Pankaj, Pavunny, Shojan P., Katiyar, Ram S., E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu, Mishra, A. K., Dwivedi, Abhilash, and Sharma, S. M.. Sat . "Structural phase transition of ternary dielectric SmGdO{sub 3}: Evidence from angle dispersive x-ray diffraction and Raman spectroscopic studies". United States. doi:10.1063/1.4913776.
@article{osti_22413209,
title = {Structural phase transition of ternary dielectric SmGdO{sub 3}: Evidence from angle dispersive x-ray diffraction and Raman spectroscopic studies},
author = {Sharma, Yogesh, E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu and Sahoo, Satyaprakash, E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu and Misra, Pankaj and Pavunny, Shojan P. and Katiyar, Ram S., E-mail: rkatiyar@uprrp.edu, E-mail: satya504@gmail.com, E-mail: yogesh.sharma@upr.edu and Mishra, A. K. and Dwivedi, Abhilash and Sharma, S. M.},
abstractNote = {High-pressure synchrotron based angle dispersive x-ray diffraction (ADXRD) studies were carried out on SmGdO{sub 3} (SGO) up to 25.7 GPa at room temperature. ADXRD results indicated a reversible pressure-induced phase transition from ambient monoclinic to hexagonal phase at ∼8.9 GPa. The observed pressure-volume data were fitted with the third order Birch-Murnaghan equation of state yielding zero pressure bulk modulus B{sub 0} = 132(22) and 177(9) GPa for monoclinic (B-type) and hexagonal (A-type) phases, respectively. Pressure dependent micro-Raman spectroscopy further confirmed the monoclinic to hexagonal phase transition at about 5.24 GPa. The mode Grüneisen parameters and pressure coefficients for different Raman modes corresponding to each individual phases of SGO were calculated using pressure dependent Raman mode analysis.},
doi = {10.1063/1.4913776},
journal = {Journal of Applied Physics},
number = 9,
volume = 117,
place = {United States},
year = {Sat Mar 07 00:00:00 EST 2015},
month = {Sat Mar 07 00:00:00 EST 2015}
}