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Title: Capping layer-tailored interface magnetic anisotropy in ultrathin Co{sub 2}FeAl films

Abstract

Co{sub 2}FeAl (CFA) thin films of various thicknesses (2 nm ≤ d ≤ 50 nm) have been grown on (001) MgO single crystal substrates and then capped with Cr, V, and Ta. Their magnetic and structural properties have been studied by x-ray diffraction (XRD), vibrating sample magnetometry, and broadband microstrip ferromagnetic resonance (MS-FMR). The XRD revealed that the films are epitaxial with the cubic [001] CFA axis normal to the substrate plane and that the chemical order varies from the B2 phase to the A2 phase when decreasing the thickness. The deduced lattice parameters showed that the Cr-capped films exhibit a larger tetragonal distortion, as compared with the films capped with V or Ta. The presence of magnetic dead layers has been observed in CFA samples capped with V and Ta but not in the case of the Cr-capped ones. The effective magnetization, deduced from the fit of MS-FMR measurements, increases (decreases) linearly with the CFA inverse thickness (1/d) for the Cr-capped (Ta-capped) films while it is constant for the V-capped ones. This allows quantifying the perpendicular surface anisotropy coefficients of −0.46 erg/cm{sup 2} and 0.74 erg/cm{sup 2} for Cr and Ta-capped films, respectively. Moreover, the fourfold and the uniaxial anisotropy fields, measured in these films, showed differentmore » trends with a respect to the CFA inverse thickness. This allows inferring that a non-negligible part of the fourfold magnetocrystalline term is of interfacial origin.« less

Authors:
; ;  [1]; ;  [2];  [2];  [3]
  1. LSPM (CNRS-UPR 3407), Université Paris 13, Sorbonne Paris Cité, 99 Avenue Jean-Baptiste Clément, 93430 Villetaneuse (France)
  2. Center for Superconductivity, Spintronics and Surface Science, Department of Physics and Chemistry, Technical University of Cluj-Napoca, Str. Memorandumului No. 28, RO-400114 Cluj-Napoca (Romania)
  3. (France)
Publication Date:
OSTI Identifier:
22412821
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 2; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ALUMINIUM ALLOYS; ANISOTROPY; COBALT BASE ALLOYS; COMPARATIVE EVALUATIONS; EPITAXY; FERROMAGNETIC RESONANCE; INTERFACES; IRON ALLOYS; LATTICE PARAMETERS; LAYERS; MAGNESIUM OXIDES; MAGNETIZATION; MONOCRYSTALS; SUBSTRATES; SURFACES; THICKNESS; THIN FILMS; X-RAY DIFFRACTION

Citation Formats

Belmeguenai, M., E-mail: belmeguenai.mohamed@univ-paris13.fr, Zighem, F., Chérif, S. M., Gabor, M. S., E-mail: mihai.gabor@phys.utcluj.ro, Petrisor, T., Tiusan, C., and Institut Jean Lamour, CNRS, Lorraine Université, BP 70239, F-54506 Vandoeuvre. Capping layer-tailored interface magnetic anisotropy in ultrathin Co{sub 2}FeAl films. United States: N. p., 2015. Web. doi:10.1063/1.4905688.
Belmeguenai, M., E-mail: belmeguenai.mohamed@univ-paris13.fr, Zighem, F., Chérif, S. M., Gabor, M. S., E-mail: mihai.gabor@phys.utcluj.ro, Petrisor, T., Tiusan, C., & Institut Jean Lamour, CNRS, Lorraine Université, BP 70239, F-54506 Vandoeuvre. Capping layer-tailored interface magnetic anisotropy in ultrathin Co{sub 2}FeAl films. United States. doi:10.1063/1.4905688.
Belmeguenai, M., E-mail: belmeguenai.mohamed@univ-paris13.fr, Zighem, F., Chérif, S. M., Gabor, M. S., E-mail: mihai.gabor@phys.utcluj.ro, Petrisor, T., Tiusan, C., and Institut Jean Lamour, CNRS, Lorraine Université, BP 70239, F-54506 Vandoeuvre. Wed . "Capping layer-tailored interface magnetic anisotropy in ultrathin Co{sub 2}FeAl films". United States. doi:10.1063/1.4905688.
@article{osti_22412821,
title = {Capping layer-tailored interface magnetic anisotropy in ultrathin Co{sub 2}FeAl films},
author = {Belmeguenai, M., E-mail: belmeguenai.mohamed@univ-paris13.fr and Zighem, F. and Chérif, S. M. and Gabor, M. S., E-mail: mihai.gabor@phys.utcluj.ro and Petrisor, T. and Tiusan, C. and Institut Jean Lamour, CNRS, Lorraine Université, BP 70239, F-54506 Vandoeuvre},
abstractNote = {Co{sub 2}FeAl (CFA) thin films of various thicknesses (2 nm ≤ d ≤ 50 nm) have been grown on (001) MgO single crystal substrates and then capped with Cr, V, and Ta. Their magnetic and structural properties have been studied by x-ray diffraction (XRD), vibrating sample magnetometry, and broadband microstrip ferromagnetic resonance (MS-FMR). The XRD revealed that the films are epitaxial with the cubic [001] CFA axis normal to the substrate plane and that the chemical order varies from the B2 phase to the A2 phase when decreasing the thickness. The deduced lattice parameters showed that the Cr-capped films exhibit a larger tetragonal distortion, as compared with the films capped with V or Ta. The presence of magnetic dead layers has been observed in CFA samples capped with V and Ta but not in the case of the Cr-capped ones. The effective magnetization, deduced from the fit of MS-FMR measurements, increases (decreases) linearly with the CFA inverse thickness (1/d) for the Cr-capped (Ta-capped) films while it is constant for the V-capped ones. This allows quantifying the perpendicular surface anisotropy coefficients of −0.46 erg/cm{sup 2} and 0.74 erg/cm{sup 2} for Cr and Ta-capped films, respectively. Moreover, the fourfold and the uniaxial anisotropy fields, measured in these films, showed different trends with a respect to the CFA inverse thickness. This allows inferring that a non-negligible part of the fourfold magnetocrystalline term is of interfacial origin.},
doi = {10.1063/1.4905688},
journal = {Journal of Applied Physics},
number = 2,
volume = 117,
place = {United States},
year = {Wed Jan 14 00:00:00 EST 2015},
month = {Wed Jan 14 00:00:00 EST 2015}
}