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Title: Investigation of inelastic electron tunneling spectra of metal-molecule-metal junctions fabricated using direct metal transfer method

Abstract

We measured the inelastic electron tunneling spectroscopy (IETS) characteristics of metal-molecule-metal junctions made with alkanethiolate self-assembled monolayers. The molecular junctions were fabricated using a direct metal transfer method, which we previously reported for high-yield metal-molecule-metal junctions. The measured IETS data could be assigned to molecular vibration modes that were determined by the chemical structure of the molecules. We also observed discrepancies and device-to-device variations in the IETS data that possibly originate from defects in the molecular junctions and insulating walls introduced during the fabrication process and from the junction structure.

Authors:
; ; ; ; ; ; ;  [1];  [2];  [3];  [4]
  1. Department of Physics and Astronomy, Institute of Applied Physics, Seoul National University, Seoul 151-747 (Korea, Republic of)
  2. Institute of Modern Optics, Nankai University, Tianjin 300071 (China)
  3. Department of Applied Physics, Kyung Hee University, Yongin-si, Gyeonggi-do 446–701 (Korea, Republic of)
  4. Department of Applied Physics, Hanyang University, Ansan 426-791 (Korea, Republic of)
Publication Date:
OSTI Identifier:
22412623
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 6; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRIC CONTACTS; ELECTRON SPECTROSCOPY; ELECTRONS; FABRICATION; METALS; MOLECULAR STRUCTURE; MOLECULES; OSCILLATION MODES; SEMICONDUCTOR JUNCTIONS; TUNNEL EFFECT

Citation Formats

Jeong, Hyunhak, Hwang, Wang-Taek, Kim, Pilkwang, Kim, Dongku, Jang, Yeonsik, Min, Misook, Park, Yun Daniel, Lee, Takhee, E-mail: tlee@snu.ac.kr, Xiang, Dong, Song, Hyunwook, and Jeong, Heejun, E-mail: hjeong@hanyang.ac.kr. Investigation of inelastic electron tunneling spectra of metal-molecule-metal junctions fabricated using direct metal transfer method. United States: N. p., 2015. Web. doi:10.1063/1.4908185.
Jeong, Hyunhak, Hwang, Wang-Taek, Kim, Pilkwang, Kim, Dongku, Jang, Yeonsik, Min, Misook, Park, Yun Daniel, Lee, Takhee, E-mail: tlee@snu.ac.kr, Xiang, Dong, Song, Hyunwook, & Jeong, Heejun, E-mail: hjeong@hanyang.ac.kr. Investigation of inelastic electron tunneling spectra of metal-molecule-metal junctions fabricated using direct metal transfer method. United States. doi:10.1063/1.4908185.
Jeong, Hyunhak, Hwang, Wang-Taek, Kim, Pilkwang, Kim, Dongku, Jang, Yeonsik, Min, Misook, Park, Yun Daniel, Lee, Takhee, E-mail: tlee@snu.ac.kr, Xiang, Dong, Song, Hyunwook, and Jeong, Heejun, E-mail: hjeong@hanyang.ac.kr. Mon . "Investigation of inelastic electron tunneling spectra of metal-molecule-metal junctions fabricated using direct metal transfer method". United States. doi:10.1063/1.4908185.
@article{osti_22412623,
title = {Investigation of inelastic electron tunneling spectra of metal-molecule-metal junctions fabricated using direct metal transfer method},
author = {Jeong, Hyunhak and Hwang, Wang-Taek and Kim, Pilkwang and Kim, Dongku and Jang, Yeonsik and Min, Misook and Park, Yun Daniel and Lee, Takhee, E-mail: tlee@snu.ac.kr and Xiang, Dong and Song, Hyunwook and Jeong, Heejun, E-mail: hjeong@hanyang.ac.kr},
abstractNote = {We measured the inelastic electron tunneling spectroscopy (IETS) characteristics of metal-molecule-metal junctions made with alkanethiolate self-assembled monolayers. The molecular junctions were fabricated using a direct metal transfer method, which we previously reported for high-yield metal-molecule-metal junctions. The measured IETS data could be assigned to molecular vibration modes that were determined by the chemical structure of the molecules. We also observed discrepancies and device-to-device variations in the IETS data that possibly originate from defects in the molecular junctions and insulating walls introduced during the fabrication process and from the junction structure.},
doi = {10.1063/1.4908185},
journal = {Applied Physics Letters},
number = 6,
volume = 106,
place = {United States},
year = {Mon Feb 09 00:00:00 EST 2015},
month = {Mon Feb 09 00:00:00 EST 2015}
}