Analysis and design of nonlocal spin devices with electric-field-induced spin-transport acceleration
Journal Article
·
· Journal of Applied Physics
- Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama (Japan)
We apply electric-field-induced acceleration for spin transport to a four-terminal nonlocal device and theoretically analyze its Hanle-effect signals. The effect of the ferromagnetic contact widths of the spin injector and detector on the signals is carefully discussed. Although Hanle-effect signals are randomized owing to the effect of the contact widths, this can be excluded by selecting an appropriate electric field for acceleration of spin transport. Spin lifetime can be correctly extracted by nonlocal devices with electric-field acceleration even using the spin injector and detector with finite contact widths.
- OSTI ID:
- 22410116
- Journal Information:
- Journal of Applied Physics, Vol. 117, Issue 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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