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Title: Intrinsic Gilbert damping constant in epitaxial Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si Heusler alloys films

Abstract

The (001)-oriented and (110)-oriented epitaxial grown Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si films were fabricated by magnetron sputtering technique in order to investigate the annealing temperature dependence of the intrinsic Gilbert damping constant (α). The stuck films, deposited on MgO and Al{sub 2}O{sub 3} a-plane substrates, respectively, were annealed at various temperatures ranging from 400 °C to 550 °C. The X-ray diffraction analysis was conducted to confirm that all the films were epitaxially grown. In addition, the ferromagnetic resonance measurements as well as the vibrating sample magnetometer were carried out to determine their magnetic properties. A small α of 0.004 was recorded for the sample with 001-oriented Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si (CFMS (001)) and 110-oriented CFMS (CFMS (110)) annealed at 450 °C.

Authors:
;  [1]; ; ;  [2]
  1. Department of Electronic Engineering, Tohoku University, 6-6-05, Aza-Aoba, Aramaki, Aoba-ku, Sendai 980-8579 (Japan)
  2. Department of Applied Physics, Tohoku University, 6-6-05, Aza-Aoba, Aramaki, Aoba-ku, Sendai 980-8579 (Japan)
Publication Date:
OSTI Identifier:
22410069
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 117; Journal Issue: 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ALUMINIUM OXIDES; ANNEALING; COBALT COMPOUNDS; DAMPING; EPITAXY; FERROMAGNETIC RESONANCE; FILMS; HEUSLER ALLOYS; IRON COMPOUNDS; MAGNESIUM OXIDES; MAGNETIC PROPERTIES; MANGANESE SILICIDES; SUBSTRATES; TEMPERATURE DEPENDENCE; VIBRATING SAMPLE MAGNETOMETERS; X-RAY DIFFRACTION

Citation Formats

Kwilu, Augustin L., E-mail: kwilu6@ecei.tohoku.ac.jp, Sahashi, Masashi, Oogane, Mikihiko, Naganuma, Hiroshi, and Ando, Yasuo. Intrinsic Gilbert damping constant in epitaxial Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si Heusler alloys films. United States: N. p., 2015. Web. doi:10.1063/1.4917334.
Kwilu, Augustin L., E-mail: kwilu6@ecei.tohoku.ac.jp, Sahashi, Masashi, Oogane, Mikihiko, Naganuma, Hiroshi, & Ando, Yasuo. Intrinsic Gilbert damping constant in epitaxial Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si Heusler alloys films. United States. doi:10.1063/1.4917334.
Kwilu, Augustin L., E-mail: kwilu6@ecei.tohoku.ac.jp, Sahashi, Masashi, Oogane, Mikihiko, Naganuma, Hiroshi, and Ando, Yasuo. Thu . "Intrinsic Gilbert damping constant in epitaxial Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si Heusler alloys films". United States. doi:10.1063/1.4917334.
@article{osti_22410069,
title = {Intrinsic Gilbert damping constant in epitaxial Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si Heusler alloys films},
author = {Kwilu, Augustin L., E-mail: kwilu6@ecei.tohoku.ac.jp and Sahashi, Masashi and Oogane, Mikihiko and Naganuma, Hiroshi and Ando, Yasuo},
abstractNote = {The (001)-oriented and (110)-oriented epitaxial grown Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si films were fabricated by magnetron sputtering technique in order to investigate the annealing temperature dependence of the intrinsic Gilbert damping constant (α). The stuck films, deposited on MgO and Al{sub 2}O{sub 3} a-plane substrates, respectively, were annealed at various temperatures ranging from 400 °C to 550 °C. The X-ray diffraction analysis was conducted to confirm that all the films were epitaxially grown. In addition, the ferromagnetic resonance measurements as well as the vibrating sample magnetometer were carried out to determine their magnetic properties. A small α of 0.004 was recorded for the sample with 001-oriented Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si (CFMS (001)) and 110-oriented CFMS (CFMS (110)) annealed at 450 °C.},
doi = {10.1063/1.4917334},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 17,
volume = 117,
place = {United States},
year = {2015},
month = {5}
}