skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Néel temperature of Cr{sub 2}O{sub 3} in Cr{sub 2}O{sub 3}/Co exchange-coupled system: Effect of buffer layer

Abstract

The lattice parameter dependence of the Néel temperature T{sub N} of thin Cr{sub 2}O{sub 3} in a Cr{sub 2}O{sub 3}/Co exchange-coupled system is investigated. Lattice-mismatch-induced strain is generated in Cr{sub 2}O{sub 3} by using different buffer layers. The lattice parameters are determined from out-of-plane and in-plane X-ray diffraction measurements. The Néel temperature is detected by direct temperature-dependent magnetization measurement as well as the temperature-dependent interface exchange coupling energy. It is observed that in-plane lattice contraction can enhance T{sub N} in Cr{sub 2}O{sub 3}, which is consistent with theoretical calculations.

Authors:
; ; ;  [1];  [2]
  1. Department of Electronic Engineering, Tohoku University, Sendai 980-8579 (Japan)
  2. Advanced Technology Development Center, TDK Corporation, Ichikawa 272-0026 (Japan)
Publication Date:
OSTI Identifier:
22410067
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CHROMIUM OXIDES; COBALT; COUPLING; CRYSTAL DEFECTS; INTERFACES; LATTICE PARAMETERS; LAYERS; MAGNETIZATION; NEEL TEMPERATURE; STRAINS; TEMPERATURE DEPENDENCE; X-RAY DIFFRACTION

Citation Formats

Pati, Satya Prakash, E-mail: sppati@ecei.tohoku.ac.jp, E-mail: phy-satya@yahoo.co.in, Shimomura, Naoki, Nozaki, Tomohiro, Sahashi, Masashi, and Shibata, Tatsuo. Néel temperature of Cr{sub 2}O{sub 3} in Cr{sub 2}O{sub 3}/Co exchange-coupled system: Effect of buffer layer. United States: N. p., 2015. Web. doi:10.1063/1.4917263.
Pati, Satya Prakash, E-mail: sppati@ecei.tohoku.ac.jp, E-mail: phy-satya@yahoo.co.in, Shimomura, Naoki, Nozaki, Tomohiro, Sahashi, Masashi, & Shibata, Tatsuo. Néel temperature of Cr{sub 2}O{sub 3} in Cr{sub 2}O{sub 3}/Co exchange-coupled system: Effect of buffer layer. United States. doi:10.1063/1.4917263.
Pati, Satya Prakash, E-mail: sppati@ecei.tohoku.ac.jp, E-mail: phy-satya@yahoo.co.in, Shimomura, Naoki, Nozaki, Tomohiro, Sahashi, Masashi, and Shibata, Tatsuo. Thu . "Néel temperature of Cr{sub 2}O{sub 3} in Cr{sub 2}O{sub 3}/Co exchange-coupled system: Effect of buffer layer". United States. doi:10.1063/1.4917263.
@article{osti_22410067,
title = {Néel temperature of Cr{sub 2}O{sub 3} in Cr{sub 2}O{sub 3}/Co exchange-coupled system: Effect of buffer layer},
author = {Pati, Satya Prakash, E-mail: sppati@ecei.tohoku.ac.jp, E-mail: phy-satya@yahoo.co.in and Shimomura, Naoki and Nozaki, Tomohiro and Sahashi, Masashi and Shibata, Tatsuo},
abstractNote = {The lattice parameter dependence of the Néel temperature T{sub N} of thin Cr{sub 2}O{sub 3} in a Cr{sub 2}O{sub 3}/Co exchange-coupled system is investigated. Lattice-mismatch-induced strain is generated in Cr{sub 2}O{sub 3} by using different buffer layers. The lattice parameters are determined from out-of-plane and in-plane X-ray diffraction measurements. The Néel temperature is detected by direct temperature-dependent magnetization measurement as well as the temperature-dependent interface exchange coupling energy. It is observed that in-plane lattice contraction can enhance T{sub N} in Cr{sub 2}O{sub 3}, which is consistent with theoretical calculations.},
doi = {10.1063/1.4917263},
journal = {Journal of Applied Physics},
number = 17,
volume = 117,
place = {United States},
year = {Thu May 07 00:00:00 EDT 2015},
month = {Thu May 07 00:00:00 EDT 2015}
}