Spin Seebeck devices using local on-chip heating
Abstract
A micro-patterned spin Seebeck device is fabricated using an on-chip heater. Current is driven through a Au heater layer electrically isolated from a bilayer consisting of Fe{sub 3}O{sub 4} (insulating ferrimagnet) and a spin detector layer. It is shown that through this method it is possible to measure the longitudinal spin Seebeck effect (SSE) for small area magnetic devices, equivalent to traditional macroscopic SSE experiments. Using a lock-in detection technique, it is possible to more sensitively characterize both the SSE and the anomalous Nernst effect (ANE), as well as the inverse spin Hall effect in various spin detector materials. By using the spin detector layer as a thermometer, we can obtain a value for the temperature gradient across the device. These results are well matched to values obtained through electromagnetic/thermal modeling of the device structure and with large area spin Seebeck measurements.
- Authors:
-
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
- Publication Date:
- OSTI Identifier:
- 22410014
- Resource Type:
- Journal Article
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Volume: 117; Journal Issue: 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DETECTION; ELECTRIC CURRENTS; FERRIMAGNETIC MATERIALS; FERRIMAGNETISM; FERRITES; GOLD; HALL EFFECT; HEATERS; HEATING; IRON OXIDES; LAYERS; NERNST EFFECT; SEEBECK EFFECT; SPIN; TEMPERATURE GRADIENTS
Citation Formats
Wu, Stephen M., E-mail: swu@anl.gov, Fradin, Frank Y., Hoffman, Jason, Hoffmann, Axel, and Bhattacharya, Anand. Spin Seebeck devices using local on-chip heating. United States: N. p., 2015.
Web. doi:10.1063/1.4916188.
Wu, Stephen M., E-mail: swu@anl.gov, Fradin, Frank Y., Hoffman, Jason, Hoffmann, Axel, & Bhattacharya, Anand. Spin Seebeck devices using local on-chip heating. United States. https://doi.org/10.1063/1.4916188
Wu, Stephen M., E-mail: swu@anl.gov, Fradin, Frank Y., Hoffman, Jason, Hoffmann, Axel, and Bhattacharya, Anand. 2015.
"Spin Seebeck devices using local on-chip heating". United States. https://doi.org/10.1063/1.4916188.
@article{osti_22410014,
title = {Spin Seebeck devices using local on-chip heating},
author = {Wu, Stephen M., E-mail: swu@anl.gov and Fradin, Frank Y. and Hoffman, Jason and Hoffmann, Axel and Bhattacharya, Anand},
abstractNote = {A micro-patterned spin Seebeck device is fabricated using an on-chip heater. Current is driven through a Au heater layer electrically isolated from a bilayer consisting of Fe{sub 3}O{sub 4} (insulating ferrimagnet) and a spin detector layer. It is shown that through this method it is possible to measure the longitudinal spin Seebeck effect (SSE) for small area magnetic devices, equivalent to traditional macroscopic SSE experiments. Using a lock-in detection technique, it is possible to more sensitively characterize both the SSE and the anomalous Nernst effect (ANE), as well as the inverse spin Hall effect in various spin detector materials. By using the spin detector layer as a thermometer, we can obtain a value for the temperature gradient across the device. These results are well matched to values obtained through electromagnetic/thermal modeling of the device structure and with large area spin Seebeck measurements.},
doi = {10.1063/1.4916188},
url = {https://www.osti.gov/biblio/22410014},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 17,
volume = 117,
place = {United States},
year = {Thu May 07 00:00:00 EDT 2015},
month = {Thu May 07 00:00:00 EDT 2015}
}
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