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Title: Effect of Ru thickness on spin pumping in Ru/Py bilayer

Abstract

We report the effect of Ru thickness (t{sub Ru}) on ferromagnetic resonance (FMR) line-width of Ru(t{sub Ru})/Py(23 nm) bilayer samples grown on Si(100)/SiO{sub 2} substrates at room temperature by magnetron sputtering. The FMR line-width is found to vary linearly with frequency for all thicknesses of Ru, indicating intrinsic origin of damping. For Ru thicknesses below 15 nm, Gilbert-damping parameter, α is almost constant. We ascribe this behavior to spin back flow that is operative for Ru thicknesses lower than the spin diffusion length in Ru, λ{sub sd}. For thicknesses >15 nm (>λ{sub sd}), the damping constant increases with Ru thickness, indicating spin pumping from Py into Ru.

Authors:
; ; ; ;  [1]
  1. Department of Physics, Thin Film Laboratory, Indian Institute of Technology Delhi, New Delhi 110016 (India)
Publication Date:
OSTI Identifier:
22409920
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 117; Journal Issue: 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DIFFUSION LENGTH; FERROMAGNETIC RESONANCE; INTERFACES; LAYERS; LINE WIDTHS; RUTHENIUM; SILICA; SILICON; SILICON OXIDES; SPIN; SPUTTERING; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; THICKNESS; THIN FILMS

Citation Formats

Behera, Nilamani, Singh, M. Sanjoy, Chaudhary, Sujeet, Pandya, Dinesh K., E-mail: dkpandya@physics.iitd.ac.in, and Muduli, P. K. Effect of Ru thickness on spin pumping in Ru/Py bilayer. United States: N. p., 2015. Web. doi:10.1063/1.4913510.
Behera, Nilamani, Singh, M. Sanjoy, Chaudhary, Sujeet, Pandya, Dinesh K., E-mail: dkpandya@physics.iitd.ac.in, & Muduli, P. K. Effect of Ru thickness on spin pumping in Ru/Py bilayer. United States. doi:10.1063/1.4913510.
Behera, Nilamani, Singh, M. Sanjoy, Chaudhary, Sujeet, Pandya, Dinesh K., E-mail: dkpandya@physics.iitd.ac.in, and Muduli, P. K. Thu . "Effect of Ru thickness on spin pumping in Ru/Py bilayer". United States. doi:10.1063/1.4913510.
@article{osti_22409920,
title = {Effect of Ru thickness on spin pumping in Ru/Py bilayer},
author = {Behera, Nilamani and Singh, M. Sanjoy and Chaudhary, Sujeet and Pandya, Dinesh K., E-mail: dkpandya@physics.iitd.ac.in and Muduli, P. K.},
abstractNote = {We report the effect of Ru thickness (t{sub Ru}) on ferromagnetic resonance (FMR) line-width of Ru(t{sub Ru})/Py(23 nm) bilayer samples grown on Si(100)/SiO{sub 2} substrates at room temperature by magnetron sputtering. The FMR line-width is found to vary linearly with frequency for all thicknesses of Ru, indicating intrinsic origin of damping. For Ru thicknesses below 15 nm, Gilbert-damping parameter, α is almost constant. We ascribe this behavior to spin back flow that is operative for Ru thicknesses lower than the spin diffusion length in Ru, λ{sub sd}. For thicknesses >15 nm (>λ{sub sd}), the damping constant increases with Ru thickness, indicating spin pumping from Py into Ru.},
doi = {10.1063/1.4913510},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 17,
volume = 117,
place = {United States},
year = {2015},
month = {5}
}