A simple and wide-range refractive index measuring approach by using a sub-micron grating
Abstract
This paper presents the design and simulation results of a high-precision low-cost refractometer that demonstrates the main advantage of a wide measurement range (1 ≤ n ≤ 2). The proposed design is based on the diffractive properties of sub-micron gratings and Snell's Law. The precision and uncertainty factors of the proposed system were tested and analyzed, revealing that the proposed refractometer demonstrates a wide measurement range with sensitivity of 10{sup −4}.
- Authors:
-
- Department of Power Mechanical Engineering, National Tsing Hua University, 101 Section 2, Kuang-Fu Road, Hsinchu 30013, Taiwan (China)
- Publication Date:
- OSTI Identifier:
- 22398894
- Resource Type:
- Journal Article
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 106; Journal Issue: 15; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ACCURACY; COMPUTERIZED SIMULATION; DESIGN; DIFFRACTION; DIFFRACTION GRATINGS; REFRACTIVE INDEX; SENSITIVITY
Citation Formats
Liu, Chun-Wei, Wu, Chun-Che, and Lin, Shih-Chieh. A simple and wide-range refractive index measuring approach by using a sub-micron grating. United States: N. p., 2015.
Web. doi:10.1063/1.4918326.
Liu, Chun-Wei, Wu, Chun-Che, & Lin, Shih-Chieh. A simple and wide-range refractive index measuring approach by using a sub-micron grating. United States. https://doi.org/10.1063/1.4918326
Liu, Chun-Wei, Wu, Chun-Che, and Lin, Shih-Chieh. 2015.
"A simple and wide-range refractive index measuring approach by using a sub-micron grating". United States. https://doi.org/10.1063/1.4918326.
@article{osti_22398894,
title = {A simple and wide-range refractive index measuring approach by using a sub-micron grating},
author = {Liu, Chun-Wei and Wu, Chun-Che and Lin, Shih-Chieh},
abstractNote = {This paper presents the design and simulation results of a high-precision low-cost refractometer that demonstrates the main advantage of a wide measurement range (1 ≤ n ≤ 2). The proposed design is based on the diffractive properties of sub-micron gratings and Snell's Law. The precision and uncertainty factors of the proposed system were tested and analyzed, revealing that the proposed refractometer demonstrates a wide measurement range with sensitivity of 10{sup −4}.},
doi = {10.1063/1.4918326},
url = {https://www.osti.gov/biblio/22398894},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 15,
volume = 106,
place = {United States},
year = {Mon Apr 13 00:00:00 EDT 2015},
month = {Mon Apr 13 00:00:00 EDT 2015}
}
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