Ptychographic x-ray imaging of surfaces on crystal truncation rod

Zhu, Chenhui; Barbour, Andi; Liu, Yaohua; You, Hoydoo; Harder, Ross; Xu, Ruqing; Diaz, Ana; Menzel, Andreas; Komanicky, Vladimir; Huang, Xiaojing; Pierce, Michael S.

doi:10.1063/1.4914927

Title: Ptychographic x-ray imaging of surfaces on crystal truncation rod

Journal Article · Mon Mar 09 00:00:00 EDT 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4914927· OSTI ID:22395697

Zhu, Chenhui; Barbour, Andi; Liu, Yaohua; You, Hoydoo ^[1]; Harder, Ross; Xu, Ruqing ^[2]; Diaz, Ana; Menzel, Andreas ^[3]; Komanicky, Vladimir ^[4]; Huang, Xiaojing ^[5]; Pierce, Michael S. ^[6]

Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Paul Scherrer Institut, Villigen PSI 5232 (Switzerland)
Faculty of Sciences, Safarik University, Kosice 04154 (Slovakia)
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973 (United States)
School of Physics and Astronomy, Rochester Institute of Technology, Rochester, New York 14623 (United States)

Ptychography is a high-resolution imaging technique, which does not require lenses for image magnification and which provides phase contrast with high sensitivity. Here, we propose to use x-ray ptychography for the imaging of surface structure in crystalline samples. We show that ptychography can be used to image atomic step structures using coherent diffraction patterns recorded along the crystal truncation rod of a crystal surface. In a proof-of-concept experiment on a Pt (111) sample, we present ptychographic reconstructions showing features consistent with surface steps. Due to the penetration power of x-rays, this method could find interesting applications for the study of surface structures under buried interfaces or in harsh environments.

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OSTI ID:: 22395697

Journal Information:: Applied Physics Letters, Vol. 106, Issue 10; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951

Country of Publication:: United States

Language:: English

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A Monte Carlo ray-tracing simulation of coherent X-ray diffractive imaging Fevola, Giovanni; Bergbäck Knudsen, Erik; Ramos, Tiago Journal of Synchrotron Radiation, Vol. 27, Issue 1 https://doi.org/10.1107/s1600577519014425	journal	January 2020
Coherent amplitude modulation imaging based on partially saturated diffraction pattern Pan, Xingchen; Liu, Cheng; Zhu, Jianqiang Optics Express, Vol. 26, Issue 17 https://doi.org/10.1364/oe.26.021929	journal	January 2018
Dynamical effects in Bragg coherent x-ray diffraction imaging of finite crystals Shabalin, Anatoly; Yefanov, Oleksandr; Nosik, Valery Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2018-00334	text	January 2017
A versatile nanoreactor for complementary in situ X-ray and electron microscopy studies in catalysis and materials science Fam, Yakub; Sheppard, Thomas L.; Becher, Johannes International Union of Crystallography https://doi.org/10.5445/ir/1000099145	text	January 2019

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