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Title: Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2

Abstract

A new multipurpose x-ray reflectometer station has been developed and augmented at the microfocus beamline (BL-16) of Indus-2 synchrotron radiation source to facilitate synchronous measurements of specular x-ray reflectivity and grazing incidence x-ray fluorescence emission from thin layered structures. The design and various salient features of the x-ray reflectometer are discussed. The performance of the reflectometer has been evaluated by analyzing several thin layered structures having different surface interface properties. The results reveal in-depth information for precise determination of surface and interface properties of thin layered materials demonstrating the immense potential of the combined measurements of x-ray reflectivity and grazing incidence fluorescence on a single reflectometer.

Authors:
; ; ; ;  [1]
  1. Indus Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore-452013 (India)
Publication Date:
OSTI Identifier:
22392513
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 5; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; DEPTH; DESIGN; FLUORESCENCE; INDUS-2; INTERFACES; PERFORMANCE; REFLECTIVITY; SURFACES; X RADIATION

Citation Formats

Das, Gangadhar, Kane, S. R., Khooha, Ajay, Singh, A. K., and Tiwari, M. K., E-mail: mktiwari@rrcat.gov.in. Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2. United States: N. p., 2015. Web. doi:10.1063/1.4919557.
Das, Gangadhar, Kane, S. R., Khooha, Ajay, Singh, A. K., & Tiwari, M. K., E-mail: mktiwari@rrcat.gov.in. Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2. United States. doi:10.1063/1.4919557.
Das, Gangadhar, Kane, S. R., Khooha, Ajay, Singh, A. K., and Tiwari, M. K., E-mail: mktiwari@rrcat.gov.in. Fri . "Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2". United States. doi:10.1063/1.4919557.
@article{osti_22392513,
title = {Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2},
author = {Das, Gangadhar and Kane, S. R. and Khooha, Ajay and Singh, A. K. and Tiwari, M. K., E-mail: mktiwari@rrcat.gov.in},
abstractNote = {A new multipurpose x-ray reflectometer station has been developed and augmented at the microfocus beamline (BL-16) of Indus-2 synchrotron radiation source to facilitate synchronous measurements of specular x-ray reflectivity and grazing incidence x-ray fluorescence emission from thin layered structures. The design and various salient features of the x-ray reflectometer are discussed. The performance of the reflectometer has been evaluated by analyzing several thin layered structures having different surface interface properties. The results reveal in-depth information for precise determination of surface and interface properties of thin layered materials demonstrating the immense potential of the combined measurements of x-ray reflectivity and grazing incidence fluorescence on a single reflectometer.},
doi = {10.1063/1.4919557},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 5,
volume = 86,
place = {United States},
year = {2015},
month = {5}
}