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Title: Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement

Abstract

Electrons at surface may behave differently from those in bulk of a material. Multi-functional tools are essential in comprehensive studies on a crystal surface. Here, we developed an in situ microscopic four-point probe (4PP) transport measurement system on the basis of a scanning tunneling microscope (STM). In particular, convenient replacement between STM tips and micro-4PPs enables systematic investigations of surface morphology, electronic structure, and electrical transport property of a same sample surface. Performances of the instrument are demonstrated with high-quality STM images, tunneling spectra, and low-noise electrical I-V characteristic curves of a single-layer FeSe film grown on a conductive SrTiO{sub 3} surface.

Authors:
; ; ; ; ;  [1]
  1. Key Laboratory of Artificial Structures and Quantum Control (Ministry of Education), Department of Physics and Astronomy, Shanghai Jiao Tong University, 800 Dongchuan Road, Shanghai 200240 (China)
Publication Date:
OSTI Identifier:
22392502
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 5; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 36 MATERIALS SCIENCE; CRYSTALS; DIAGRAMS; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; FILMS; IRON SELENIDES; MORPHOLOGY; NOISE; PROBES; SCANNING TUNNELING MICROSCOPY; STRONTIUM TITANATES; SURFACES; TUNNEL EFFECT

Citation Formats

Ge, Jian-Feng, Liu, Zhi-Long, Gao, Chun-Lei, Qian, Dong, Liu, Canhua, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn, and Jia, Jin-Feng, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn. Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement. United States: N. p., 2015. Web. doi:10.1063/1.4919766.
Ge, Jian-Feng, Liu, Zhi-Long, Gao, Chun-Lei, Qian, Dong, Liu, Canhua, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn, & Jia, Jin-Feng, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn. Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement. United States. doi:10.1063/1.4919766.
Ge, Jian-Feng, Liu, Zhi-Long, Gao, Chun-Lei, Qian, Dong, Liu, Canhua, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn, and Jia, Jin-Feng, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn. Fri . "Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement". United States. doi:10.1063/1.4919766.
@article{osti_22392502,
title = {Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement},
author = {Ge, Jian-Feng and Liu, Zhi-Long and Gao, Chun-Lei and Qian, Dong and Liu, Canhua, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn and Jia, Jin-Feng, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn},
abstractNote = {Electrons at surface may behave differently from those in bulk of a material. Multi-functional tools are essential in comprehensive studies on a crystal surface. Here, we developed an in situ microscopic four-point probe (4PP) transport measurement system on the basis of a scanning tunneling microscope (STM). In particular, convenient replacement between STM tips and micro-4PPs enables systematic investigations of surface morphology, electronic structure, and electrical transport property of a same sample surface. Performances of the instrument are demonstrated with high-quality STM images, tunneling spectra, and low-noise electrical I-V characteristic curves of a single-layer FeSe film grown on a conductive SrTiO{sub 3} surface.},
doi = {10.1063/1.4919766},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 5,
volume = 86,
place = {United States},
year = {2015},
month = {5}
}