Structural and optical investigation of Te-based chalcogenide thin films

Journal Article · Fri May 15 00:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4915434· OSTI ID:22391749

Sharma, Rita; Sharma, Shaveta; Thangaraj, R.; Mian, M. ^[1]; Chander, Ravi ^[2]; Kumar, Praveen ^[3]

---

1. Semiconductors Laboratory, Department of Physics, GND University, Amritsar (India)
2. Applied Science Deptt. Govt. Polytechnic College Amritsar (India)
3. Department of Physics, DAV University, Sarmastipur, Jalandhar-144012 (India)

We report the structural and optical properties of thermally evaporated Bi{sub 2}Te{sub 3}, In{sub 2}Te{sub 3} and InBiTe{sub 3} films by using X-ray diffraction, optical and Raman Spectroscopy techniques. The as-prepared thin films were found to be Semi-crystalline by X-ray diffraction. Particle Size and Strain has been calculated from XRD data. The optical constants, film thickness, refractive index and optical band gap (E{sub g}) has been reported for In{sub 2}Te{sub 3}, InBiTe{sub 3} films. Raman Spectroscopy was performed to investigate the effect of Bi, In, on lattice vibration and chemical bonding in Te based chalcogenide glassy alloys.

• OSTI ID: 22391749
• Journal Information: AIP Conference Proceedings, Vol. 1661, Issue 1; Conference: ICCMP 2014: International Conference on Condensed Matter Physics 2014, Shimla (India), 4-6 Nov 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BISMUTH TELLURIDES
CHEMICAL BONDS
ELECTRONIC STRUCTURE
ENERGY GAP
INDIUM TELLURIDES
METALLIC GLASSES
PARTICLE SIZE
RAMAN SPECTROSCOPY
REFRACTIVE INDEX
STRAINS
THIN FILMS
X-RAY DIFFRACTION