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Title: Structural and optical investigation of Te-based chalcogenide thin films

Abstract

We report the structural and optical properties of thermally evaporated Bi{sub 2}Te{sub 3}, In{sub 2}Te{sub 3} and InBiTe{sub 3} films by using X-ray diffraction, optical and Raman Spectroscopy techniques. The as-prepared thin films were found to be Semi-crystalline by X-ray diffraction. Particle Size and Strain has been calculated from XRD data. The optical constants, film thickness, refractive index and optical band gap (E{sub g}) has been reported for In{sub 2}Te{sub 3}, InBiTe{sub 3} films. Raman Spectroscopy was performed to investigate the effect of Bi, In, on lattice vibration and chemical bonding in Te based chalcogenide glassy alloys.

Authors:
; ; ;  [1];  [2];  [3]
  1. Semiconductors Laboratory, Department of Physics, GND University, Amritsar (India)
  2. Applied Science Deptt. Govt. Polytechnic College Amritsar (India)
  3. Department of Physics, DAV University, Sarmastipur, Jalandhar-144012 (India)
Publication Date:
OSTI Identifier:
22391749
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1661; Journal Issue: 1; Conference: ICCMP 2014: International Conference on Condensed Matter Physics 2014, Shimla (India), 4-6 Nov 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BISMUTH TELLURIDES; CHEMICAL BONDS; ELECTRONIC STRUCTURE; ENERGY GAP; INDIUM TELLURIDES; METALLIC GLASSES; PARTICLE SIZE; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; STRAINS; THIN FILMS; X-RAY DIFFRACTION

Citation Formats

Sharma, Rita, E-mail: reetasharma2012@gmail.com, Sharma, Shaveta, Thangaraj, R., Mian, M., Chander, Ravi, and Kumar, Praveen. Structural and optical investigation of Te-based chalcogenide thin films. United States: N. p., 2015. Web. doi:10.1063/1.4915434.
Sharma, Rita, E-mail: reetasharma2012@gmail.com, Sharma, Shaveta, Thangaraj, R., Mian, M., Chander, Ravi, & Kumar, Praveen. Structural and optical investigation of Te-based chalcogenide thin films. United States. doi:10.1063/1.4915434.
Sharma, Rita, E-mail: reetasharma2012@gmail.com, Sharma, Shaveta, Thangaraj, R., Mian, M., Chander, Ravi, and Kumar, Praveen. Fri . "Structural and optical investigation of Te-based chalcogenide thin films". United States. doi:10.1063/1.4915434.
@article{osti_22391749,
title = {Structural and optical investigation of Te-based chalcogenide thin films},
author = {Sharma, Rita, E-mail: reetasharma2012@gmail.com and Sharma, Shaveta and Thangaraj, R. and Mian, M. and Chander, Ravi and Kumar, Praveen},
abstractNote = {We report the structural and optical properties of thermally evaporated Bi{sub 2}Te{sub 3}, In{sub 2}Te{sub 3} and InBiTe{sub 3} films by using X-ray diffraction, optical and Raman Spectroscopy techniques. The as-prepared thin films were found to be Semi-crystalline by X-ray diffraction. Particle Size and Strain has been calculated from XRD data. The optical constants, film thickness, refractive index and optical band gap (E{sub g}) has been reported for In{sub 2}Te{sub 3}, InBiTe{sub 3} films. Raman Spectroscopy was performed to investigate the effect of Bi, In, on lattice vibration and chemical bonding in Te based chalcogenide glassy alloys.},
doi = {10.1063/1.4915434},
journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1661,
place = {United States},
year = {2015},
month = {5}
}