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Title: Effect of thermal annealing on structure and optical band gap of Se{sub 66}Te{sub 25}In{sub 9} thin films

Abstract

Thin films of a-Se{sub 66}Te{sub 25}In{sub 9} have been deposited onto a chemically cleaned glass substrate by thermal evaporation technique under vacuum. Glassy nature of the films has been ascertained by X-ray diffraction pattern. The analysis of absorption spectra, measured at normal incidence, in the spectral range 400-1100 nm has been used for the optical characterization of thin films under investigation. The effect of thermal annealing on structure and optical band gap (E{sub g}) of a-Se{sub 66}Te{sub 25}In{sub 9} have been studied.

Authors:
; ;  [1];  [2]
  1. Amorphous Semiconductor Research Lab Department of Physics, M.M.M. University of Technology, Gorakhpur-273010 (India)
  2. Department of Physics, K.I.E.T., Ghaziabad (India)
Publication Date:
OSTI Identifier:
22391746
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1661; Journal Issue: 1; Conference: ICCMP 2014: International Conference on Condensed Matter Physics 2014, Shimla (India), 4-6 Nov 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION SPECTRA; ANNEALING; CRYSTAL STRUCTURE; ELECTRONIC STRUCTURE; ENERGY GAP; EVAPORATION; GLASS; INDIUM TELLURIDES; SELENIDES; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION

Citation Formats

Dwivedi, D. K., Pathak, H. P., Shukla, Nitesh, and Kumar, Vipin, E-mail: todkdwivedi@gmail.com. Effect of thermal annealing on structure and optical band gap of Se{sub 66}Te{sub 25}In{sub 9} thin films. United States: N. p., 2015. Web. doi:10.1063/1.4915428.
Dwivedi, D. K., Pathak, H. P., Shukla, Nitesh, & Kumar, Vipin, E-mail: todkdwivedi@gmail.com. Effect of thermal annealing on structure and optical band gap of Se{sub 66}Te{sub 25}In{sub 9} thin films. United States. doi:10.1063/1.4915428.
Dwivedi, D. K., Pathak, H. P., Shukla, Nitesh, and Kumar, Vipin, E-mail: todkdwivedi@gmail.com. Fri . "Effect of thermal annealing on structure and optical band gap of Se{sub 66}Te{sub 25}In{sub 9} thin films". United States. doi:10.1063/1.4915428.
@article{osti_22391746,
title = {Effect of thermal annealing on structure and optical band gap of Se{sub 66}Te{sub 25}In{sub 9} thin films},
author = {Dwivedi, D. K. and Pathak, H. P. and Shukla, Nitesh and Kumar, Vipin, E-mail: todkdwivedi@gmail.com},
abstractNote = {Thin films of a-Se{sub 66}Te{sub 25}In{sub 9} have been deposited onto a chemically cleaned glass substrate by thermal evaporation technique under vacuum. Glassy nature of the films has been ascertained by X-ray diffraction pattern. The analysis of absorption spectra, measured at normal incidence, in the spectral range 400-1100 nm has been used for the optical characterization of thin films under investigation. The effect of thermal annealing on structure and optical band gap (E{sub g}) of a-Se{sub 66}Te{sub 25}In{sub 9} have been studied.},
doi = {10.1063/1.4915428},
journal = {AIP Conference Proceedings},
number = 1,
volume = 1661,
place = {United States},
year = {Fri May 15 00:00:00 EDT 2015},
month = {Fri May 15 00:00:00 EDT 2015}
}